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Security Evaluation of WDDL and SecLib Countermeasures against Power Attacks
Security Evaluation of WDDL and SecLib Countermeasures against Power Attacks
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Security Evaluation of WDDL and SecLib Countermeasures against Power Attacks

Guilley, S. ; Sauvage, L. ; Hoogvorst, P. ; Pacalet, R. ; Bertoni, G.M. ; Chaudhuri, S.

IEEE transactions on computers, 2008-11, Vol.57 (11), p.1482-1497 [Periódico revisado por pares]

New York: IEEE

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2
Aerosol/Cloud Measurements Using Coherent Wind Doppler Lidars
Aerosol/Cloud Measurements Using Coherent Wind Doppler Lidars
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Aerosol/Cloud Measurements Using Coherent Wind Doppler Lidars

Royer, Philippe ; Boquet, Matthieu ; Cariou, Jean-Pierre ; Sauvage, Laurent ; Parmentier, Rémy Moshary, F. ; Gross, B. ; Arend, M.

EPJ Web of Conferences, 2016, Vol.119, p.11002 [Periódico revisado por pares]

Les Ulis: EDP Sciences

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3
Hardware Trojan Horses in Cryptographic IP Cores
Hardware Trojan Horses in Cryptographic IP Cores
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Hardware Trojan Horses in Cryptographic IP Cores

Bhasin, Shivam ; Danger, Jean-Luc ; Guilley, Sylvain ; Ngo, Xuan Thuy ; Sauvage, Laurent

2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2013, p.15-29

IEEE

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4
Analysis of Electromagnetic Information Leakage From Cryptographic Devices With Different Physical Structures
Analysis of Electromagnetic Information Leakage From Cryptographic Devices With Different Physical Structures
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Analysis of Electromagnetic Information Leakage From Cryptographic Devices With Different Physical Structures

Hayashi, Y. ; Homma, N. ; Mizuki, T. ; Aoki, T. ; Sone, H. ; Sauvage, L. ; Danger, J. L.

IEEE transactions on electromagnetic compatibility, 2013-06, Vol.55 (3), p.571-580 [Periódico revisado por pares]

IEEE

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5
Efficient Evaluation of EM Radiation Associated With Information Leakage From Cryptographic Devices
Efficient Evaluation of EM Radiation Associated With Information Leakage From Cryptographic Devices
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Efficient Evaluation of EM Radiation Associated With Information Leakage From Cryptographic Devices

Hayashi, Y. ; Homma, N. ; Mizuki, T. ; Shimada, H. ; Aoki, T. ; Sone, H. ; Sauvage, L. ; Danger, J. L.

IEEE transactions on electromagnetic compatibility, 2013-06, Vol.55 (3), p.555-563 [Periódico revisado por pares]

IEEE

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6
Evaluation of Power Constant Dual-Rail Logics Countermeasures against DPA with Design Time Security Metrics
Evaluation of Power Constant Dual-Rail Logics Countermeasures against DPA with Design Time Security Metrics
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Evaluation of Power Constant Dual-Rail Logics Countermeasures against DPA with Design Time Security Metrics

Guilley, Sylvain ; Sauvage, Laurent ; Flament, Florent ; Vinh-Nga Vong ; Hoogvorst, Philippe ; Pacalet, Renaud

IEEE transactions on computers, 2010-09, Vol.59 (9), p.1250-1263 [Periódico revisado por pares]

New York: IEEE

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7
Characterization of Electromagnetic Fault Injection on a 32-bit Microcontroller Instruction Buffer
Characterization of Electromagnetic Fault Injection on a 32-bit Microcontroller Instruction Buffer
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Characterization of Electromagnetic Fault Injection on a 32-bit Microcontroller Instruction Buffer

Trabelsi Ltci, Oualid ; Sauvage Ltci, Laurent ; Danger Ltci, Jean-Luc

2020 Asian Hardware Oriented Security and Trust Symposium (AsianHOST), 2020, p.1-6

IEEE

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8
Advanced Analysis of Faults Injected Through Conducted Intentional Electromagnetic Interferences
Advanced Analysis of Faults Injected Through Conducted Intentional Electromagnetic Interferences
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Advanced Analysis of Faults Injected Through Conducted Intentional Electromagnetic Interferences

Sauvage, L. ; Danger, J. ; Guilley, S. ; Homma, N. ; Hayashi, Y-I

IEEE transactions on electromagnetic compatibility, 2013-06, Vol.55 (3), p.589-596 [Periódico revisado por pares]

IEEE

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9
The impact of pulsed electromagnetic fault injection on true random number generators
The impact of pulsed electromagnetic fault injection on true random number generators
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The impact of pulsed electromagnetic fault injection on true random number generators

Madau, Maxime ; Agoyan, Michel ; Balasch, Josep ; Grujic, Milos ; Haddad, Patrick ; Maurine, Philippe ; Rozic, Vladimir ; Singelée, Dave ; Yang, Bohan ; Verbauwhede, Ingrid

IEEE 2018

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10
Far correlation-based EMA with a precharacterized leakage model
Far correlation-based EMA with a precharacterized leakage model
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Far correlation-based EMA with a precharacterized leakage model

Meynard, Olivier ; Guilley, Sylvain ; Danger, Jean-Luc ; Sauvage, Laurent

2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010), 2010, p.977-980

European Design and Automation Association

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