Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Scanning tunnelling engineeringSchneiker, Conrad ; Hameroff, Stuart ; Voelker, Mark ; He, Jackson ; Dereniak, Eustace ; McCuskey, RobertThe Monthly Microscopical Journal, 1870-03, Vol.3 (3), p.585-596 [Periódico revisado por pares]Oxford, UK: Blackwell Publishing LtdTexto completo disponível |
2 |
Material Type: Artigo
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Measurement of Activity of Single Molecules of β -D-galactosidaseRotman, BorisProceedings of the National Academy of Sciences - PNAS, 1961-12, Vol.47 (12), p.1981-1991 [Periódico revisado por pares]United States: National Academy of Sciences of the United States of AmericaTexto completo disponível |
3 |
Material Type: Artigo
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The behaviour of electronic components at low operating stress levelsReiche, H.Microelectronics and reliability, 1966-01, Vol.5 (1), p.1-6 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
4 |
Material Type: Artigo
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The use of equivalent networks to minimize the tolerance of passive thin film circuitsNeuman, M.R. ; Ko, Wen-HsiungMicroelectronics and reliability, 1966-01, Vol.5 (4), p.329-335 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
5 |
Material Type: Artigo
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Multiple faults and confidence levels resolution of a paradoxBriggs, N.H. ; Yarnell, J.Microelectronics and reliability, 1966-01, Vol.5 (4), p.265-266 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
6 |
Material Type: Artigo
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Prediction and engineering assessment in early designCole, W.P.Microelectronics and reliability, 1966-01, Vol.5 (2), p.129-144 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
7 |
Material Type: Artigo
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Polymer insulating films for cryotron fabricationAllam, D.S. ; Stoddart, C.T.H. ; Stuart, P.R.Microelectronics and reliability, 1966-01, Vol.5 (1), p.19-25 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
8 |
Material Type: Artigo
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Measurement of minority carrier lifetime with a non-ohmic contact and an electron beamMunakata, C.Microelectronics and reliability, 1966-01, Vol.5 (4), p.267,IN11,269-268,IN12,270 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
9 |
Material Type: Artigo
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Resistor tolerancesReiche, H.Microelectronics and reliability, 1966-01, Vol.5 (2), p.175-177 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
10 |
Material Type: Artigo
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Integrated high figure of merit monolithic thin-film compatible logic circuits for data processingFuschillo, N. ; Kroboth, J.Microelectronics and reliability, 1966-01, Vol.5 (2), p.145,IN1,149-148,IN6,159 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |