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Fe-Al alloy single-crystal thin film preparation for basic magnetic measurements
Fe-Al alloy single-crystal thin film preparation for basic magnetic measurements
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Fe-Al alloy single-crystal thin film preparation for basic magnetic measurements

Abe, Tatsuya ; Kawai, Tetsuroh ; Futamoto, Masaaki ; Ohtake, Mitsuru ; Inaba, Nobuyuki

AIP advances, 2018-04, Vol.8 (4), p.047710-047710-9 [Periódico revisado por pares]

Melville: American Institute of Physics

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2
Surface acoustic waves increase magnetic domain wall velocity
Surface acoustic waves increase magnetic domain wall velocity
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Surface acoustic waves increase magnetic domain wall velocity

Adhikari, A. ; Adenwalla, S.

AIP advances, 2021-01, Vol.11 (1), p.015234-015234-5 [Periódico revisado por pares]

Melville: American Institute of Physics

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3
Intercalation induced ferromagnetism in group-V transition metal dichalcogenide bilayer
Intercalation induced ferromagnetism in group-V transition metal dichalcogenide bilayer
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Intercalation induced ferromagnetism in group-V transition metal dichalcogenide bilayer

Ahamd, H. M. R. ; Zhou, Jian

AIP advances, 2020-04, Vol.10 (4), p.045323-045323-7 [Periódico revisado por pares]

Melville: American Institute of Physics

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4
Fabrication of soft-magnetic FeAlSi thin films with nm-order thickness for the free layer of magnetic tunnel junction based sensors
Fabrication of soft-magnetic FeAlSi thin films with nm-order thickness for the free layer of magnetic tunnel junction based sensors
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Fabrication of soft-magnetic FeAlSi thin films with nm-order thickness for the free layer of magnetic tunnel junction based sensors

Akamatsu, Shoma ; Oogane, Mikihiko ; Tsunoda, Masakiyo ; Ando, Yasuo

AIP advances, 2020-01, Vol.10 (1), p.015302-015302-4 [Periódico revisado por pares]

Melville: American Institute of Physics

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5
Structure and magnetism of Fe-doped BaSnO3 thin films
Structure and magnetism of Fe-doped BaSnO3 thin films
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Structure and magnetism of Fe-doped BaSnO3 thin films

Alaan, Urusa S. ; N’Diaye, Alpha T. ; Shafer, Padraic ; Arenholz, Elke ; Suzuki, Yuri

AIP advances, 2017-05, Vol.7 (5), p.055716-055716-7 [Periódico revisado por pares]

Melville: American Institute of Physics

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6
Tailoring of magnetic properties of ultrathin epitaxial Fe films by Dy doping
Tailoring of magnetic properties of ultrathin epitaxial Fe films by Dy doping
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Tailoring of magnetic properties of ultrathin epitaxial Fe films by Dy doping

Baker, A. A. ; Figueroa, A. I. ; van der Laan, G. ; Hesjedal, T.

AIP advances, 2015-07, Vol.5 (7), p.077117-077117-7 [Periódico revisado por pares]

Melville: American Institute of Physics

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7
Depth-resolved magnetization profile of MgO/CoFeB/W perpendicular half magnetic tunnel junctions
Depth-resolved magnetization profile of MgO/CoFeB/W perpendicular half magnetic tunnel junctions
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Depth-resolved magnetization profile of MgO/CoFeB/W perpendicular half magnetic tunnel junctions

Bansal, V. ; Tonnerre, J.-M. ; Mossang, E. ; Ortega, L. ; Fettar, F. ; Chatterjee, J. ; Auffret, S. ; Prejbeanu, I.-L. ; Dieny, B.

AIP advances, 2022-03, Vol.12 (3), p.035129-035129-5 [Periódico revisado por pares]

Melville: American Institute of Physics

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8
Thickness dependent exchange bias in martensitic epitaxial Ni-Mn-Sn thin films
Thickness dependent exchange bias in martensitic epitaxial Ni-Mn-Sn thin films
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Thickness dependent exchange bias in martensitic epitaxial Ni-Mn-Sn thin films

Behler, Anna ; Teichert, Niclas ; Dutta, Biswanath ; Waske, Anja ; Hickel, Tilmann ; Auge, Alexander ; Hütten, Andreas ; Eckert, Jürgen

AIP advances, 2013-12, Vol.3 (12), p.122112-122112-9 [Periódico revisado por pares]

Melville: American Institute of Physics

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9
Growth-sequence-dependent interface magnetism of SrIrO3–La0.7Sr0.3MnO3 bilayers
Growth-sequence-dependent interface magnetism of SrIrO3–La0.7Sr0.3MnO3 bilayers
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Growth-sequence-dependent interface magnetism of SrIrO3–La0.7Sr0.3MnO3 bilayers

Bergmann, L. ; Düring, P. ; Agrestini, S. ; Efimenko, A. ; Liao, S.-C. ; Hu, Z. ; Gargiani, P. ; Choi, C.-J. ; Baik, H. ; Park, D.-S. ; Dörr, K. ; Rata, A. D.

AIP advances, 2020-03, Vol.10 (3), p.035132-1-035132-8 [Periódico revisado por pares]

Melville: American Institute of Physics

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10
Investigation on the origin of exchange bias in epitaxial, oriented and polycrystalline Fe3O4 thin films
Investigation on the origin of exchange bias in epitaxial, oriented and polycrystalline Fe3O4 thin films
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Investigation on the origin of exchange bias in epitaxial, oriented and polycrystalline Fe3O4 thin films

Bhat, Shwetha G. ; Anil Kumar, P. S.

AIP advances, 2015-11, Vol.5 (11), p.117123-117123-13 [Periódico revisado por pares]

Melville: American Institute of Physics

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