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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Ata de Congresso
|
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Experience with a Digital Noise Analysis System in Subcriticality Measurements on a Mockup of the FFTFPare, V. K. ; Kryter, R. C. ; Mihalczo, J. T.United States 1973Texto completo disponível |
| 2 |
Material Type: Ata de Congresso
|
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Epitaxial silicon semiconductor detectors, past developments, future prospectsGruhn, C RUnited States 1976Texto completo disponível |
| 3 |
Material Type: Ata de Congresso
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Thin epitaxial silicon for dE/dx detectorsMaggiore, C J ; Goldstone, P D ; Gruhn, C R ; Jarmie, N ; Stotlar, S C ; DeHaven, H VUnited States 1976Texto completo disponível |
| 4 |
Material Type: Ata de Congresso
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All epitaxial silicon diode heavy ion detectorGruhn, C R ; Goldstone, P D ; Jarmie, NUnited States 1976Texto completo disponível |
| 5 |
Material Type: Ata de Congresso
|
|
Fast-Neutron Detector for Use as a Criticality MonitorFriesen, Richard D.United States 1976Texto completo disponível |
| 6 |
Material Type: Ata de Congresso
|
|
Position-sensitive gas proportional chambersMorris, C L ; Hoffmann, G W ; Thiessen, H AUnited States 1977Texto completo disponível |
| 7 |
Material Type: Ata de Congresso
|
|
Characteristics of computed tomographic reconstruction noise and their effect on detectabilityHanson, K M ; Boyd, D PUnited States 1977Texto completo disponível |
| 8 |
Material Type: Ata de Congresso
|
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Energy resolution considerations in liquid ionization chambersEdmiston, M D ; Gruhn, C RUnited States 1977Texto completo disponível |
| 9 |
Material Type: Ata de Congresso
|
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Pulsed system for obtaining microdosimetric data with high intensity beamsZaider, M ; Dicello, J F ; Hiebert, R DUnited States 1977Texto completo disponível |
| 10 |
Material Type: Ata de Congresso
|
|
Class of near-perfect coded aperturesCannon, T M ; Fenimore, E EUnited States 1977Texto completo disponível |
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