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Refinado por: Base de dados/Biblioteca: EZB Electronic Journals Library remover Base de dados/Biblioteca: Engineered Materials Abstracts remover idioma: Chinês remover
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1
Defect-induced Analogue Resistive Switching Behavior in FeOx-based Memristor and Synaptic Paired-pulse Facilitation Feature
Defect-induced Analogue Resistive Switching Behavior in FeOx-based Memristor and Synaptic Paired-pulse Facilitation Feature
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Defect-induced Analogue Resistive Switching Behavior in FeOx-based Memristor and Synaptic Paired-pulse Facilitation Feature

Wang, Tongyu ; Ran, Haofeng ; Zhou, Guangdong

Wu ji cai liao xue bao, 2023-04, Vol.38 (4), p.437 [Periódico revisado por pares]

Beijing: Chinese Academy of Sciences

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2
Multi-target detection in dual-frequency pulse Doppler radar based on six-port technology
Multi-target detection in dual-frequency pulse Doppler radar based on six-port technology
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Multi-target detection in dual-frequency pulse Doppler radar based on six-port technology

Xu, Shan ; Liu, Fa-Lin

Zhōngguó kēxué jìshù dàxué xuébào, 2009-02, Vol.39 (2), p.137-141

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3
Construction of a measurement and control system for a sawyer motor-driven planar motion stage
Construction of a measurement and control system for a sawyer motor-driven planar motion stage
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Construction of a measurement and control system for a sawyer motor-driven planar motion stage

Tano, M ; Gao, Wei ; Dian, S Y ; Kiyono, S ; Tomita, Y ; Makino, K ; Motita, H

Na mi ji shu yu jing mi gong cheng, 2006-09, Vol.4 (3), p.182-189 [Periódico revisado por pares]

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4
Michelson interferometer wave-meter with high precision under the control of single-chip computer
Michelson interferometer wave-meter with high precision under the control of single-chip computer
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Michelson interferometer wave-meter with high precision under the control of single-chip computer

Peng, Yue-Xiang ; Wang, Li-Qiang ; Ning, Ke-Qing

Na mi ji shu yu jing mi gong cheng, 2007-06, Vol.5 (2), p.153-156 [Periódico revisado por pares]

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5
Properties of highly oriented transparent KTN/SiO(2) (100) film prepared by PLD
Properties of highly oriented transparent KTN/SiO(2) (100) film prepared by PLD
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Properties of highly oriented transparent KTN/SiO(2) (100) film prepared by PLD

Wang, Xiao-Dong ; Peng, Xiao-Feng ; Zhang, Duan-Ming

Wu ji cai liao xue bao, 2005-09, Vol.20 (5), p.1222-1228 [Periódico revisado por pares]

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6
Dielectric Spectroscopy, a Modern Method for Microstructural Characterization of Materials
Dielectric Spectroscopy, a Modern Method for Microstructural Characterization of Materials
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Dielectric Spectroscopy, a Modern Method for Microstructural Characterization of Materials

Gavrila, Doina Elena

Journal of materials science and engineering. A, 2014, Vol.4 (1), p.18-26

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7
Flexible Ti-Ni-N Thin Films Prepared by Magnetron Sputtering
Flexible Ti-Ni-N Thin Films Prepared by Magnetron Sputtering
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Flexible Ti-Ni-N Thin Films Prepared by Magnetron Sputtering

Musil, Jindrich ; Jilek, Richard ; Cerstvy, Radomir

Journal of materials science and engineering. A, 2014, Vol.4 (1), p.27-33

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8
Annealing Effects on the Optical and Structural Properties of DLC Films
Annealing Effects on the Optical and Structural Properties of DLC Films
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Annealing Effects on the Optical and Structural Properties of DLC Films

Mostafa, AA-NA ; Hayrapetyan, D ; Panosyan, Z

Journal of materials science and engineering. B, 2012-04, Vol.2 (4), p.295-299

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9
Preparation of Polycarbonate/Clay Nanocomposite and Characterization by X-Ray, Thermal Analyzes and Low-Field Nuclear Magnetic Resonance
Preparation of Polycarbonate/Clay Nanocomposite and Characterization by X-Ray, Thermal Analyzes and Low-Field Nuclear Magnetic Resonance
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Preparation of Polycarbonate/Clay Nanocomposite and Characterization by X-Ray, Thermal Analyzes and Low-Field Nuclear Magnetic Resonance

Merat, P P ; Tavares, MIB ; da Silva, EO

Journal of materials science and engineering. A, 2011-10, Vol.1 (5), p.671-677

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10
Analysis of Cracks Resulting from Thermite Welding of Cathodic Protection
Analysis of Cracks Resulting from Thermite Welding of Cathodic Protection
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Analysis of Cracks Resulting from Thermite Welding of Cathodic Protection

Marjan, S ; Simon, B ; Andrej, Z ; Robert, C ; Borut, B

Journal of materials science and engineering. A, 2011-09, Vol.1 (4), p.512-517

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