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1
Combinatorial image analysis 10th international workshop, IWCIA 2004, Auckland, New Zealand December 1-3, 2004 : proceedings
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Combinatorial image analysis 10th international workshop, IWCIA 2004, Auckland, New Zealand December 1-3, 2004 : proceedings

International Workshop on Combinatorial Image Analysis (10th 2004 Auckland, N.Z.) Reinhard Klette; Jovisa Zun ic; International Association for Pattern Recognition

Berlin Springer New York c2004

Acesso online. A biblioteca também possui exemplares impressos.

2
Graphics recognition recent advances and perspectives : 5th international workshop, GREC 2003, Barcelona, Spain, July 30-31, 2003 : revised selected papers
Material Type:
Livro
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Graphics recognition recent advances and perspectives : 5th international workshop, GREC 2003, Barcelona, Spain, July 30-31, 2003 : revised selected papers

GREC 2003 (2003 Barcelona, Spain) Josep Llad os 1968; Young-Bin Kwon

Berlin Springer New York c2004

Acesso online. A biblioteca também possui exemplares impressos.

3
Morphological Image Analysis: Principles and Applications
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Livro
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Morphological Image Analysis: Principles and Applications

Soille, Pierre

Berlin, Heidelberg: Springer Berlin / Heidelberg 2004

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4
Combinatorial image analysis 11th international workshop, IWCIA 2006, Berlin, Germany, June 19-21 2006 : proceedings
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Livro
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Combinatorial image analysis 11th international workshop, IWCIA 2006, Berlin, Germany, June 19-21 2006 : proceedings

International Workshop on Combinatorial Image Analysis (11th 2006 Berlin, Germany) Ulrich Eckardt; Boris Flach; Uwe Knauer; Konrad Polthier (1961-....); Ralf Reulke; International Association for Pattern Recognition

Berlin Springer New York c2006

Acesso online. A biblioteca também possui exemplares impressos.

5
Graphics recognition ten years review and future perspectives : 6th international workshop GREC 2005, Hong Kong, China, August 25-26, 2005 : revised selected papers
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Livro
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Graphics recognition ten years review and future perspectives : 6th international workshop GREC 2005, Hong Kong, China, August 25-26, 2005 : revised selected papers

International Workshop on Graphics Recognition (6th 2005 Hong Kong, China) Wenyin Liu; Josep Llad os 1968; International Association for Pattern Recognition

Berlin Springer New York c2006

Localização: ICMC - Inst. Ciên. Mat. Computação    (68-02 LNCS v.3926 ) e outros locais(Acessar)

6
Document analysis systems VII 7th international workshop, DAS 2006, Nelson, New Zealand, February 13-15, 2006 : proceedings
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Livro
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Document analysis systems VII 7th international workshop, DAS 2006, Nelson, New Zealand, February 13-15, 2006 : proceedings

DAS 2006 (2006 Nelson, N.Z.) Horst Bunke; A. Lawrence Spitz

Berlin Springer New York c2006

Localização: ICMC - Inst. Ciên. Mat. Computação    (68-02 LNCS v.3872 ) e outros locais(Acessar)

7
Local invariant feature detectors: a survey
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Livro
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Local invariant feature detectors: a survey

Tuytelaars, Tinne ; Mikolajczyk, Krystian

Foundations and trends in computer graphics and vision, 2008, Vol.3 (3), p.177-280 [Periódico revisado por pares]

Hanover, Mass: Now Publishers

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