Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Libro
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ProceedingsSymposium on Reliability (1969 Chicago)New York Institute of Electrical and Electronics Engineers 1969Disponible en EPBC - Esc. Politécnica-Bib Central (62.004.15 Sy68r 1969 )(Obténgalo) |
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2 |
Material Type: Libro
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1967 Annual Symposium on Reliability proceedings : Washington, D.C., January 10, 11, 12, 1967Symposium on Reliability (1967 Washington, D.C.) Institute of Electrical and Electronics EngineersNew York, N.Y. Institute of Electrical and Electronics Engineers c1967Disponible en EPBC - Esc. Politécnica-Bib Central (62.004.15 Sy68r 1967 )(Obténgalo) |
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3 |
Material Type: Libro
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Proceedings 1971 annual Symposium on Reliability, Washington, D. C., January 12, 13, 14, 1971Symposium on Reliability (1971 Washington, D. C.) Institute of Electrical and Electronics Engineers; Institute of Environmental Sciences; American Society for Quality ControlNew York Institute of Electrical and Electronics Engineers 1971Disponible en EPBC - Esc. Politécnica-Bib Central (62.004.15 Sy68r 1971 )(Obténgalo) |
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4 |
Material Type: Libro
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Proceedings 1968 annual Symposium on Reliability, Boston, Massachusetts, January 16, 17, 18, 1968Symposium on Reliability (1968 Boston, Mass.) Institute of Electrical and Electronics Engineers; Institute of Environmental Sciences; Society for Non-destructive Testing; American Society for Quality ControlNew York Institute of Electrical and Electronics Engineers 1968Disponible en EPBC - Esc. Politécnica-Bib Central (62.004.15 Sy68r 1968 )(Obténgalo) |
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5 |
Material Type: Libro
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Proceedings 1966 annual Symposium on Reliability, San Francisco, California, January 25, 26, 27, 1966Symposium on Reliability (1966 San Francisco, Calif.) Institute of Electrical and Electronics Engineers; Institute of Environmental Sciences; Society for Non-destructive Testing; American Society for Quality ControlNew York Institute of Electrical and Electronics Engineers 1966Disponible en EPBC - Esc. Politécnica-Bib Central (62.004.15 Sy68r 1966 )(Obténgalo) |
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6 |
Material Type: Artículo de Congreso
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Robust optimization of structural risks under epistemic uncertaintiesAndré Teófilo Beck Felipe Alexander Vargas Bazán; Wellison José de Santana Gomes; Asian-Pacific Symposium on Structural Reliability and its Applications (5. 2012 Singapore)Proceedings Singapore : Research Publishing Services, 2012Singapore Research Publishing Services 2012Comprobar fondos(Obténgalo) |
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7 |
Material Type: Artículo de Congreso
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Establishing a mutation testing educational module based on IMA-CIDEllen Francine Barbosa José Carlos Maldonado; IEEE International Symposium on Software Reliability Engineering (17. 2006 Raleigh); Workshop on Mutation Analysis (2. 2006 Raleigh)Proceedings Raleigh, 2006Raleigh 2006Acceso en línea. La biblioteca tiene también copias físicas. |
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8 |
Material Type: Artículo de Congreso
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Mutation testing applied to validate specifications based on statechartsSandra Camargo Pinto Ferraz Fabbri José Carlos Maldonado; Sugeta, Tatiana; Masiero, Paulo Cesar; International Symposium on Software Reliability Engineering (10. 1999 Boca Raton)Proceedings Los Alamitos :IEEE Computer Society,1999Los Alamitos IEEE Computer Society 1999Disponible en ICMC - Inst. Ciên. Mat. Computação (PROD-1048741 ) y otras localizaciones(Obténgalo) |
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9 |
Material Type: Artículo de Congreso
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Integrated teaching of programming foundations and software testingEllen Francine Barbosa Marco A. G Silva (Marco Aurélio Gracioto Silva); Camila K. D Corte (Camila Kozlowski Della Corte); José Carlos Maldonado; IEEE International Symposium on Software Reliability Engineering (17. 2006 Raleigh)Raleigh, 2006Santiago 2006Disponible en ICMC - Inst. Ciên. Mat. Computação (PROD-1563282 ) y otras localizaciones(Obténgalo) |
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10 |
Material Type: Libro
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Materials reliability in Microelectronics, 8Symposium on Materials Reliability in Microelectronics 1998 John...[et al] BravmanMaterials Research Society Symposia Proceedings New York, North-Holland, 1981-New York North-Holland 1981-Disponible en IFSC - Inst. Física de São Carlos (P 530.418 M425 v.516 )(Obténgalo) |