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Material Type:
Libro
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Proceedings

Symposium on Reliability (1969 Chicago)

New York Institute of Electrical and Electronics Engineers 1969

Disponible en EPBC - Esc. Politécnica-Bib Central    (62.004.15 Sy68r 1969 )(Obténgalo)

2
Material Type:
Libro
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1967 Annual Symposium on Reliability proceedings : Washington, D.C., January 10, 11, 12, 1967

Symposium on Reliability (1967 Washington, D.C.) Institute of Electrical and Electronics Engineers

New York, N.Y. Institute of Electrical and Electronics Engineers c1967

Disponible en EPBC - Esc. Politécnica-Bib Central    (62.004.15 Sy68r 1967 )(Obténgalo)

3
Material Type:
Libro
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Proceedings 1971 annual Symposium on Reliability, Washington, D. C., January 12, 13, 14, 1971

Symposium on Reliability (1971 Washington, D. C.) Institute of Electrical and Electronics Engineers; Institute of Environmental Sciences; American Society for Quality Control

New York Institute of Electrical and Electronics Engineers 1971

Disponible en EPBC - Esc. Politécnica-Bib Central    (62.004.15 Sy68r 1971 )(Obténgalo)

4
Material Type:
Libro
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Proceedings 1968 annual Symposium on Reliability, Boston, Massachusetts, January 16, 17, 18, 1968

Symposium on Reliability (1968 Boston, Mass.) Institute of Electrical and Electronics Engineers; Institute of Environmental Sciences; Society for Non-destructive Testing; American Society for Quality Control

New York Institute of Electrical and Electronics Engineers 1968

Disponible en EPBC - Esc. Politécnica-Bib Central    (62.004.15 Sy68r 1968 )(Obténgalo)

5
Material Type:
Libro
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Proceedings 1966 annual Symposium on Reliability, San Francisco, California, January 25, 26, 27, 1966

Symposium on Reliability (1966 San Francisco, Calif.) Institute of Electrical and Electronics Engineers; Institute of Environmental Sciences; Society for Non-destructive Testing; American Society for Quality Control

New York Institute of Electrical and Electronics Engineers 1966

Disponible en EPBC - Esc. Politécnica-Bib Central    (62.004.15 Sy68r 1966 )(Obténgalo)

6
Material Type:
Artículo de Congreso
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Robust optimization of structural risks under epistemic uncertainties

André Teófilo Beck Felipe Alexander Vargas Bazán; Wellison José de Santana Gomes; Asian-Pacific Symposium on Structural Reliability and its Applications (5. 2012 Singapore)

Proceedings Singapore : Research Publishing Services, 2012

Singapore Research Publishing Services 2012

Comprobar fondos(Obténgalo)

7
Material Type:
Artículo de Congreso
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Establishing a mutation testing educational module based on IMA-CID

Ellen Francine Barbosa José Carlos Maldonado; IEEE International Symposium on Software Reliability Engineering (17. 2006 Raleigh); Workshop on Mutation Analysis (2. 2006 Raleigh)

Proceedings Raleigh, 2006

Raleigh 2006

Acceso en línea. La biblioteca tiene también copias físicas.

8
Material Type:
Artículo de Congreso
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Mutation testing applied to validate specifications based on statecharts

Sandra Camargo Pinto Ferraz Fabbri José Carlos Maldonado; Sugeta, Tatiana; Masiero, Paulo Cesar; International Symposium on Software Reliability Engineering (10. 1999 Boca Raton)

Proceedings Los Alamitos :IEEE Computer Society,1999

Los Alamitos IEEE Computer Society 1999

Disponible en ICMC - Inst. Ciên. Mat. Computação    (PROD-1048741 ) y otras localizaciones(Obténgalo)

9
Material Type:
Artículo de Congreso
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Integrated teaching of programming foundations and software testing

Ellen Francine Barbosa Marco A. G Silva (Marco Aurélio Gracioto Silva); Camila K. D Corte (Camila Kozlowski Della Corte); José Carlos Maldonado; IEEE International Symposium on Software Reliability Engineering (17. 2006 Raleigh)

Raleigh, 2006

Santiago 2006

Disponible en ICMC - Inst. Ciên. Mat. Computação    (PROD-1563282 ) y otras localizaciones(Obténgalo)

10
Materials reliability in Microelectronics, 8
Material Type:
Libro
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Materials reliability in Microelectronics, 8

Symposium on Materials Reliability in Microelectronics 1998 John...[et al] Bravman

Materials Research Society Symposia Proceedings New York, North-Holland, 1981-

New York North-Holland 1981-

Disponible en IFSC - Inst. Física de São Carlos    (P 530.418 M425 v.516 )(Obténgalo)

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