Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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4H-silicon carbide as particle detector for high-intensity ion beamsChristanell, M. ; Tomaschek, M. ; Bergauer, T.Journal of instrumentation, 2022-01, Vol.17 (1), p.C01060 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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2 |
Material Type: Artigo
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Readout system and testbeam results of the RD50-MPW2 HV-CMOS pixel chipSieberer, P ; Bergauer, T ; Flöckner, K ; Irmler, C ; Steininger, HJournal of physics. Conference series, 2022-11, Vol.2374 (1), p.012096 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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3 |
Material Type: Artigo
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The impact and persistence of electrostatic charge on the passivation of silicon strip sensorsKönig, A. ; Bergauer, T. ; Schmidt, P.Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2016-12, Vol.838, p.55-61 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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4 |
Material Type: Artigo
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Performance of neutron-irradiated 4H-silicon carbide diodes subjected to alpha radiationGaggl, P. ; Gsponer, A. ; Thalmeier, R. ; Waid, S. ; Pellegrini, G. ; Godignon, P. ; Rafí, J.M. ; Bergauer, T.Journal of instrumentation, 2023-01, Vol.18 (1), p.C01042 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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5 |
Material Type: Artigo
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RD50-MPW3: a fully monolithic digital CMOS sensor for future tracking detectorsSieberer, P. ; Zhang, C. ; Bergauer, T. ; Casanova, R. ; Irmler, C. ; Karim, N. ; Mazorra de Cos, J. ; Pilsl, B. ; Vilella, E.Journal of instrumentation, 2023-02, Vol.18 (2), p.C02061 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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6 |
Material Type: Artigo
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Novel ion imaging concept based on time-of-flight measurements with low gain avalanche detectorsUlrich-Pur, F. ; Bergauer, T. ; Hirtl, A. ; Irmler, C. ; Kaser, S. ; Pitters, F. ; Rit, S.JINST, 2023-02, Vol.18 (2), p.C02062 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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7 |
Material Type: Artigo
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Different radiographic imaging modalities with a proton computed tomography demonstratorKaser, S. ; Bergauer, T. ; Burker, A. ; Frötscher, I. ; Hirtl, A. ; Irmler, C. ; Pitters, F. ; Ulrich-Pur, F.Journal of instrumentation, 2022-01, Vol.17 (1), p.C01010 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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8 |
Material Type: Artigo
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History, status and prospects of producing silicon sensors for HEP experiments at Infineon TechnologiesBergauer, T. ; Bartl, U. ; Blöch, D. ; Döcke, M. ; Dragicevic, M. ; Hacker, J. ; Hinger, V. ; König, A. ; Pree, E. ; Valentan, M.Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2019-04, Vol.924, p.1-6 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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9 |
Material Type: Artigo
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Characterization of irradiated p-type silicon detectors for TCAD surface radiation damage model validationMorozzi, A. ; Moscatelli, F. ; Lombardi, G. ; Bilei, G.M. ; Hinger, V. ; Bergauer, T. ; Passeri, D.Journal of instrumentation, 2020-01, Vol.15 (1), p.C01029-C01029 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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10 |
Material Type: Artigo
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Upgrade of Belle II vertex detector with CMOS pixel technologySchwickardi, M. ; Babeluk, M. ; Barbero, M. ; Baudot, J. ; Bergauer, T. ; Bertolone, G. ; Bettarini, S. ; Bosi, F. ; Breugnon, P. ; Buch, Y. ; Casarosa, G. ; Dujany, G. ; Finck, C. ; Forti, F. ; Frey, A. ; Himmi, A. ; Irmler, C. ; Kumar, A. ; Marinas, C. ; Massa, M. ; Massaccesi, L. ; Mazzora de Cos, J. ; Minuti, M. ; Mondal, S. ; Pangaud, P. ; Pham, H. ; Ripp-Baudot, I. ; Rizzo, G. ; Schwenker, B. ; Valin, I.JINST, 2024-01, Vol.19 (1), p.C01054 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |