Electron and hole trapping in irradiated SIMOX, ZMR and BESOI buried oxides

Stahlbush, R.E. ; Campisi, G.J. ; McKitterick, J.B. ; Maszara, W.P. ; Roitman, P. ; Brown, G.A.

IEEE transactions on nuclear science, 1992-12, Vol.39 (6), p.2086-2097 [Periódico revisado por pares]

PISCATAWAY: IEEE

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