Adherent Raindrop Modeling, Detectionand Removal in Video

You, Shaodi ; Tan, Robby T ; Kawakami, Rei ; Mukaigawa, Yasuhiro ; Ikeuchi, Katsushi

IEEE transactions on pattern analysis and machine intelligence, 2016-09, Vol.38 (9), p.1721-1733 [Periódico revisado por pares]

United States: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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