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Electronic structure of the organic semiconductor copper tetraphenylporphyrin (CuTPP)

Reid, Ian ; Zhang, Yufeng ; Demasi, Alex ; Blueser, Andrew ; Piper, Louis ; Downes, James E. ; Matsuura, Anne ; Hughes, Greg ; Smith, Kevin E.

Applied surface science, 2009-11, Vol.256 (3), p.720-725 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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Título:
Electronic structure of the organic semiconductor copper tetraphenylporphyrin (CuTPP)
Autor: Reid, Ian ; Zhang, Yufeng ; Demasi, Alex ; Blueser, Andrew ; Piper, Louis ; Downes, James E. ; Matsuura, Anne ; Hughes, Greg ; Smith, Kevin E.
Assuntos: ABSORPTION ; ABSORPTION SPECTROSCOPY ; CHEMICAL COMPOSITION ; CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; COPPER ; Copper tetraphenylporphyrin (CuTPP) ; Density functional theory, local density approximation ; Electron and ion emission by liquids and solids; impact phenomena ; Electron states ; ELECTRONIC STRUCTURE ; EMISSION SPECTROSCOPY ; Exact sciences and technology ; FINE STRUCTURE ; FUNCTIONALS ; Methods of electronic structure calculations ; national synchrotron light source ; ORGANIC SEMICONDUCTORS ; PHOTOEMISSION ; Photoemission and photoelectron spectra ; Physics ; Resonant soft X-ray emission spectroscopy ; SPECTROSCOPY ; Structure of solids and liquids; crystallography ; SYNCHROTRONS ; THIN FILMS ; VALENCE ; X-ray absorption spectroscopy ; X-ray absorption spectroscopy: exafs, nexafs, xanes, etc ; X-ray diffraction and scattering ; X-RAY PHOTOELECTRON SPECTROSCOPY ; X-ray photoemission spectroscopy
É parte de: Applied surface science, 2009-11, Vol.256 (3), p.720-725
Notas: ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
DE-AC02-98CH10886
BNL-95567-2011-JA
DOE - OFFICE OF SCIENCE
Descrição: The electronic structure of thin films of the organic semiconductor copper tetraphenylporphyrin (CuTPP) has been studied using synchrotron radiation-excited resonant soft X-ray emission spectroscopy (RSXE), near edge X-ray absorption fine structure (NEXAFS) spectroscopy, and X-ray photoemission spectroscopy (XPS). The C and N partial density of states for both the valence and conduction band electronic structure has been determined, while XPS was used to provide information on the chemical composition and the oxidation states of the copper. Good agreement was found between the experimental measurements of the valence and conduction bands and the results of density functional theory calculations.
Editor: Amsterdam: Elsevier B.V
Idioma: Inglês

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Electronic structure of the organic semiconductor copper tetraphenylporphyrin (CuTPP)

Reid, Ian ; Zhang, Yufeng ; Demasi, Alex ; Blueser, Andrew ; Piper, Louis ; Downes, James E. ; Matsuura, Anne ; Hughes, Greg ; Smith, Kevin E.

Amsterdam: Elsevier B.V

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