Comparing test-retest reliability of dynamic functional connectivity methods

Choe, Ann S. ; Nebel, Mary Beth ; Barber, Anita D. ; Cohen, Jessica R. ; Xu, Yuting ; Pekar, James J. ; Caffo, Brian ; Lindquist, Martin A.

NeuroImage (Orlando, Fla.), 2017-09, Vol.158, p.155-175 [Periódico revisado por pares]

United States: Elsevier Inc

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