Micro-Raman Scattering Properties of Highly Oriented AlN Films

Liu, Ming S. ; Nugent, K. W. ; Prawer, S. ; Bursill, L. A. ; Peng, J. L. ; Tong, Y. Z. ; Jewsbury, P.

International Journal of Modern Physics B, 1998-07, Vol.12 (19), p.1963-1974 [Periódico revisado por pares]

United States: World Scientific Publishing Company

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