Ellipsometric depth profiling of the refractive index: a neural network method and its application to a surface-induced inhomogeneity in a liquid crystal

Glorieux, C ; Schrijver, P De ; Thoen, J

Journal of physics. D, Applied physics, 1997-10, Vol.30 (19), p.2656-2662 [Periódico revisado por pares]

Bristol: IOP Publishing

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