Oxygen vacancy-driven evolution of structural and electrical properties in SrFeO3−δ thin films and a method of stabilization

Enriquez, Erik ; Chen, Aiping ; Harrell, Zach ; Lü, Xujie ; Dowden, Paul ; Koskelo, Nicholas ; Janoschek, Marc ; Chen, Chonglin ; Jia, Quanxi

Applied physics letters, 2016-10, Vol.109 (14) [Periódico revisado por pares]

Melville: American Institute of Physics

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