Activation and control of visible single defects in 4H-, 6H-, and 3C-SiC by oxidation
Lohrmann, A. ; Castelletto, S. ; Klein, J. R. ; Ohshima, T. ; Bosi, M. ; Negri, M. ; Lau, D. W. M. ; Gibson, B. C. ; Prawer, S. ; McCallum, J. C. ; Johnson, B. C.
Applied physics letters, 2016-01, Vol.108 (2) [Periódico revisado por pares]Melville: American Institute of Physics
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