In-situ optical reflectance and synchrotron X-ray topography study of defects in epitaxial dilute GaAsN on GaAs

Reentilä, O. ; Lankinen, A. ; Mattila, M. ; Säynätjoki, A. ; Tuomi, T. O. ; Lipsanen, H. ; O’Reilly, L. ; McNally, P. J.

Journal of materials science. Materials in electronics, 2008-02, Vol.19 (2), p.137-142 [Periódico revisado por pares]

Boston: Springer US

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