Resolving the depth coordinate in photoelectron spectroscopy – Comparison of excitation energy variation vs. angular-resolved XPS for the analysis of a self-assembled monolayer model system

Merzlikin, Sergiy V. ; Tolkachev, Nikolay N. ; Strunskus, Thomas ; Witte, Gregor ; Glogowski, Thomas ; Wöll, Christof ; Grünert, Wolfgang

Surface science, 2008-02, Vol.602 (3), p.755-767 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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