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Interferometric Characterization of a Semiconductor Disk Laser driven Terahertz Source

Wichmann, Matthias ; Stein, Markus ; Rahimi-Iman, Arash ; Koch, Stephan W. ; Koch, Martin

Journal of infrared, millimeter and terahertz waves, 2014-07, Vol.35 (6-7), p.503-508 [Periódico revisado por pares]

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Título:
Interferometric Characterization of a Semiconductor Disk Laser driven Terahertz Source
Autor: Wichmann, Matthias ; Stein, Markus ; Rahimi-Iman, Arash ; Koch, Stephan W. ; Koch, Martin
Assuntos: Bandwidth ; Classical Electrodynamics ; Disks ; Electrical Engineering ; Electronics and Microelectronics ; Emission ; Emission analysis ; Emitters ; Engineering ; Infrared ; Instrumentation ; Interferometry ; Lasers ; Lasing ; Semiconductors
É parte de: Journal of infrared, millimeter and terahertz waves, 2014-07, Vol.35 (6-7), p.503-508
Notas: ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
Descrição: Michelson interferometry is used to investigate the pump-power dependent emission bandwidth of a THz emitter based on intra-cavity difference frequency generation in a two-color VECSEL. A multi-mode CW THz signal is found to result from the two simultaneously lasing groups of longitudinal VECSEL modes. Power-dependent experiments reveal a clear correlation between the THz signal bandwidth and the numbers of optical modes involved.
Editor: Boston: Springer US
Idioma: Inglês

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