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Stress-induced phenomena in metallization Sixth International Workshop on Stress-Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001

International Workshop on Stress-Induced Phenomena in Metallization (6th 2001 Ithaca, N.Y.) Shefford P Baker

Localização: IF - Instituto de Física (MS AIP v.612 )(Acessar)

Título:
Stress-induced phenomena in metallization Sixth International Workshop on Stress-Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001
Autor: International Workshop on Stress-Induced Phenomena in Metallization (6th 2001 Ithaca, N.Y.)
Shefford P Baker
Assuntos: Semiconductors -- Defects -- Congresses; Metallic films -- Congresses; Thin film devices -- Defects -- Congresses; Aluminum films -- Congresses; Metallizing -- Congresses; FÍSICA
Notas: Includes bibliographical references and indexes
Títulos relacionados: Série:AIP conference proceedings no. 612
Editor: Melville, N.Y. American Institute of Physics
Data de criação/publicação: 2002
Formato: ix, 250 p. ill. 25 cm.
Idioma: Inglês

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