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Defect Formation under Nitrogen-Ion Implantation and Subsequent Annealing in GaAs Structures with an Uncovered Surface and a Surface Covered with an AlN Film
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Defect Formation under Nitrogen-Ion Implantation and Subsequent Annealing in GaAs Structures with an Uncovered Surface and a Surface Covered with an AlN Film

Sobolev, N. A. ; Sakharov, V. I. ; Serenkov, I. T. ; Bondarev, A. D. ; Karabeshkin, K. V. ; Fomin, E. V. ; Kalyadin, A. E. ; Mikoushkin, V. M. ; Shek, E. I. ; Sherstnev, E. V.

Semiconductors (Woodbury, N.Y.), 2019-04, Vol.53 (4), p.415-418 [Periódico revisado por pares]

Moscow: Pleiades Publishing

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2
Density dependence of electron mobility in the accumulation mode for fully depleted SOI films
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Density dependence of electron mobility in the accumulation mode for fully depleted SOI films

Naumova, O. V. ; Zaitseva, E. G. ; Fomin, B. I. ; Ilnitsky, M. A. ; Popov, V. P.

Semiconductors (Woodbury, N.Y.), 2015-10, Vol.49 (10), p.1316-1322 [Periódico revisado por pares]

Moscow: Pleiades Publishing

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3
Dielectric Properties of Oligonucleotides on the Surface of Si Nanosandwich Structures
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Dielectric Properties of Oligonucleotides on the Surface of Si Nanosandwich Structures

Fomin, M. A. ; Chernev, A. L. ; Bagraev, N. T. ; Klyachkin, L. E. ; Emelyanov, A. K. ; Dubina, M. V.

Semiconductors (Woodbury, N.Y.), 2018-05, Vol.52 (5), p.612-614 [Periódico revisado por pares]

Moscow: Pleiades Publishing

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4
Formation of a quasi-periodic boron distribution in silicon, initiated by ion implantation
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Formation of a quasi-periodic boron distribution in silicon, initiated by ion implantation

Myasnikov, A. M. ; Obodnikov, V. I. ; Seryapin, V. G. ; Tishkovskii, E. G. ; Fomin, B. I. ; Cherepov, E. I.

Semiconductors (Woodbury, N.Y.), 1997-03, Vol.31 (3), p.279-282 [Periódico revisado por pares]

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5
Kinetics of the redistribution of an impurity in quasiperiodic structures appearing in heavily boron-doped silicon irradiated by boron ions
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Kinetics of the redistribution of an impurity in quasiperiodic structures appearing in heavily boron-doped silicon irradiated by boron ions

Myasnikov, A. M.

Semiconductors (Woodbury, N.Y.), 1997-06, Vol.31 (6), p.600 [Periódico revisado por pares]

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6
Ordered Arrays of Ge(Si) Quantum Dots Incorporated into Two-Dimensional Photonic Crystals
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Ordered Arrays of Ge(Si) Quantum Dots Incorporated into Two-Dimensional Photonic Crystals

Smagina, Zn. V. ; Zinovyev, V. A. ; Rodyakina, E. E. ; Fomin, B. I. ; Stepikhova, M. V. ; Yablonskiy, A. N. ; Gusev, S. A. ; Novikov, A. V. ; Dvurechenskii, A. V.

Semiconductors (Woodbury, N.Y.), 2019-10, Vol.53 (10), p.1329-1333 [Periódico revisado por pares]

Moscow: Pleiades Publishing

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7
Study of the Structural and Emission Properties of Ge(Si) Quantum Dots Ordered on the Si(001) Surface
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Study of the Structural and Emission Properties of Ge(Si) Quantum Dots Ordered on the Si(001) Surface

Smagina, Zh. V. ; Zinovyev, V. A. ; Krivyakin, G. K. ; Rodyakina, E. E. ; Kuchinskaya, P. A. ; Fomin, B. I. ; Yablonskiy, A. N. ; Stepikhova, M. V. ; Novikov, A. V. ; Dvurechenskii, A. V.

Semiconductors (Woodbury, N.Y.), 2018-09, Vol.52 (9), p.1150-1155 [Periódico revisado por pares]

Moscow: Pleiades Publishing

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