Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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1‐nm Si Patterning: Patterning Si at the 1 nm Length Scale with Aberration‐Corrected Electron‐Beam Lithography: Tuning of Plasmonic Properties by Design (Adv. Funct. Mater. 52/2019)Manfrinato, Vitor R. ; Camino, Fernando E. ; Stein, Aaron ; Zhang, Lihua ; Lu, Ming ; Stach, Eric A. ; Black, Charles T.Advanced functional materials, 2019-12, Vol.29 (52), p.n/a [Periódico revisado por pares]Hoboken: Wiley Subscription Services, IncTexto completo disponível |
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2 |
Material Type: Artigo
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20 nm electron beam lithography and reactive ion etching for the fabrication of double gate FinFET devicesKretz, J. ; Dreeskornfeld, L. ; Hartwich, J. ; Rösner, W.Microelectronic engineering, 2003-06, Vol.67, p.763-768 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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3 |
Material Type: Ata de Congresso
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20 years of Microprocesses and Nanotechinology ConferenceIshihara, S. ; Okazaki, S. ; Arimoto, H.2007 Digest of papers Microprocesses and Nanotechnology, 2007, p.2-2IEEETexto completo disponível |
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4 |
Material Type: Ata de Congresso
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22 GHz direct-modulated weakly coupled DBR-laser fabricated by focused ion beam lithographyBach, L. ; Kaiser, W. ; Reithmaier, J.P. ; Forchel, A. ; Gioannini, M. ; Feies, V. ; Montrosset, I.International Conference onIndium Phosphide and Related Materials, 2003, 2003, p.190-193IEEETexto completo disponível |
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5 |
Material Type: Artigo
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22-GHz modulation bandwidth of long cavity DBR laser by using a weakly laterally coupled grating fabricated by focused ion beam lithographyBach, L. ; Kaiser, W. ; Reithmaier, J.P. ; Forchel, A. ; Gioannini, M. ; Feies, V. ; Montrosset, I.IEEE photonics technology letters, 2004-01, Vol.16 (1), p.18-20New York: IEEETexto completo disponível |
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6 |
Material Type: Artigo
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2DEG base hot electron transistors fabricated using MBE and in situ ion beam lithographyIngram, S.G. ; Linfield, E.H. ; Brown, K.M. ; Jones, G.A.C. ; Ritchie, D.A. ; Kelly, M.J.IEEE transactions on electron devices, 1995-06, Vol.42 (6), p.1065-1069 [Periódico revisado por pares]IEEETexto completo disponível |
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7 |
Material Type: Artigo
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30 GHz surface acoustic wave transducers with extremely high mass sensitivityZheng, Jiangpo ; Zhou, Jian ; Zeng, Pei ; Liu, Yi ; Shen, Yiping ; Yao, Wenze ; Chen, Zhe ; Wu, Jianhui ; Xiong, Shuo ; Chen, Yiqin ; Shi, Xianglong ; Liu, Jie ; Fu, Yongqing ; Duan, HuigaoApplied physics letters, 2020-03, Vol.116 (12) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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8 |
Material Type: Artigo
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3D Femtosecond Laser Submicron Lithography as a Way of Fabricating Spiral Phase Plates for Forming Photon Beams with Orbital Angular MomentumDemenev, A. A. ; Kovalchuk, A. V. ; Polushkin, E. A. ; Shapoval, S. YuBulletin of the Russian Academy of Sciences. Physics, 2021-02, Vol.85 (2), p.159-164 [Periódico revisado por pares]Moscow: Pleiades PublishingTexto completo disponível |
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9 |
Material Type: Artigo
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3D Microfabrication Using Emulsion Mask Grayscale Photolithography TechniqueLee, Tze Pin ; Mohamed, KhairudinIOP conference series. Materials Science and Engineering, 2016-02, Vol.114 (1), p.12032-12039 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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10 |
Material Type: Artigo
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3D Volumetric Energy Deposition of Focused Helium Ion Beam Lithography: Visualization, Modeling, and Applications in NanofabricationCai, Jingxuan ; Zhu, Zhouyang ; Alkemade, Paul F. A. ; van Veldhoven, Emile ; Wang, Qianjin ; Ge, Haixiong ; Rodrigues, Sean P. ; Cai, Wenshan ; Li, Wen‐DiAdvanced materials interfaces, 2018-06, Vol.5 (12), p.n/a [Periódico revisado por pares]Weinheim: Wiley Subscription Services, IncTexto completo disponível |