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1
1‐nm Si Patterning: Patterning Si at the 1 nm Length Scale with Aberration‐Corrected Electron‐Beam Lithography: Tuning of Plasmonic Properties by Design (Adv. Funct. Mater. 52/2019)
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Artigo
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1‐nm Si Patterning: Patterning Si at the 1 nm Length Scale with Aberration‐Corrected Electron‐Beam Lithography: Tuning of Plasmonic Properties by Design (Adv. Funct. Mater. 52/2019)

Manfrinato, Vitor R. ; Camino, Fernando E. ; Stein, Aaron ; Zhang, Lihua ; Lu, Ming ; Stach, Eric A. ; Black, Charles T.

Advanced functional materials, 2019-12, Vol.29 (52), p.n/a [Periódico revisado por pares]

Hoboken: Wiley Subscription Services, Inc

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2
20 nm electron beam lithography and reactive ion etching for the fabrication of double gate FinFET devices
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Artigo
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20 nm electron beam lithography and reactive ion etching for the fabrication of double gate FinFET devices

Kretz, J. ; Dreeskornfeld, L. ; Hartwich, J. ; Rösner, W.

Microelectronic engineering, 2003-06, Vol.67, p.763-768 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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3
20 years of Microprocesses and Nanotechinology Conference
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Ata de Congresso
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20 years of Microprocesses and Nanotechinology Conference

Ishihara, S. ; Okazaki, S. ; Arimoto, H.

2007 Digest of papers Microprocesses and Nanotechnology, 2007, p.2-2

IEEE

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4
22 GHz direct-modulated weakly coupled DBR-laser fabricated by focused ion beam lithography
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Ata de Congresso
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22 GHz direct-modulated weakly coupled DBR-laser fabricated by focused ion beam lithography

Bach, L. ; Kaiser, W. ; Reithmaier, J.P. ; Forchel, A. ; Gioannini, M. ; Feies, V. ; Montrosset, I.

International Conference onIndium Phosphide and Related Materials, 2003, 2003, p.190-193

IEEE

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5
22-GHz modulation bandwidth of long cavity DBR laser by using a weakly laterally coupled grating fabricated by focused ion beam lithography
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22-GHz modulation bandwidth of long cavity DBR laser by using a weakly laterally coupled grating fabricated by focused ion beam lithography

Bach, L. ; Kaiser, W. ; Reithmaier, J.P. ; Forchel, A. ; Gioannini, M. ; Feies, V. ; Montrosset, I.

IEEE photonics technology letters, 2004-01, Vol.16 (1), p.18-20

New York: IEEE

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6
2DEG base hot electron transistors fabricated using MBE and in situ ion beam lithography
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Artigo
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2DEG base hot electron transistors fabricated using MBE and in situ ion beam lithography

Ingram, S.G. ; Linfield, E.H. ; Brown, K.M. ; Jones, G.A.C. ; Ritchie, D.A. ; Kelly, M.J.

IEEE transactions on electron devices, 1995-06, Vol.42 (6), p.1065-1069 [Periódico revisado por pares]

IEEE

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7
30 GHz surface acoustic wave transducers with extremely high mass sensitivity
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Artigo
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30 GHz surface acoustic wave transducers with extremely high mass sensitivity

Zheng, Jiangpo ; Zhou, Jian ; Zeng, Pei ; Liu, Yi ; Shen, Yiping ; Yao, Wenze ; Chen, Zhe ; Wu, Jianhui ; Xiong, Shuo ; Chen, Yiqin ; Shi, Xianglong ; Liu, Jie ; Fu, Yongqing ; Duan, Huigao

Applied physics letters, 2020-03, Vol.116 (12) [Periódico revisado por pares]

Melville: American Institute of Physics

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8
3D Femtosecond Laser Submicron Lithography as a Way of Fabricating Spiral Phase Plates for Forming Photon Beams with Orbital Angular Momentum
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3D Femtosecond Laser Submicron Lithography as a Way of Fabricating Spiral Phase Plates for Forming Photon Beams with Orbital Angular Momentum

Demenev, A. A. ; Kovalchuk, A. V. ; Polushkin, E. A. ; Shapoval, S. Yu

Bulletin of the Russian Academy of Sciences. Physics, 2021-02, Vol.85 (2), p.159-164 [Periódico revisado por pares]

Moscow: Pleiades Publishing

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9
3D Microfabrication Using Emulsion Mask Grayscale Photolithography Technique
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Artigo
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3D Microfabrication Using Emulsion Mask Grayscale Photolithography Technique

Lee, Tze Pin ; Mohamed, Khairudin

IOP conference series. Materials Science and Engineering, 2016-02, Vol.114 (1), p.12032-12039 [Periódico revisado por pares]

Bristol: IOP Publishing

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10
3D Volumetric Energy Deposition of Focused Helium Ion Beam Lithography: Visualization, Modeling, and Applications in Nanofabrication
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3D Volumetric Energy Deposition of Focused Helium Ion Beam Lithography: Visualization, Modeling, and Applications in Nanofabrication

Cai, Jingxuan ; Zhu, Zhouyang ; Alkemade, Paul F. A. ; van Veldhoven, Emile ; Wang, Qianjin ; Ge, Haixiong ; Rodrigues, Sean P. ; Cai, Wenshan ; Li, Wen‐Di

Advanced materials interfaces, 2018-06, Vol.5 (12), p.n/a [Periódico revisado por pares]

Weinheim: Wiley Subscription Services, Inc

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