Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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A 0.314/spl mu/m/sup 2/ 6T-SRAM cell build with tall triple-gate devices for 45nm applications using 0.75NA 193nm lithographyNackaerts, A. ; Ercken, M. ; Demuynck, S. ; Lauwers, A. ; Baerts, C. ; Bender, H. ; Boulaert, W. ; Collaert, N. ; Degroote, B. ; Delvaux, C. ; de Marneffe, J.F. ; Dixit, A. ; De Meyer, K. ; Hendrickx, E. ; Heylen, N. ; Jaenen, P. ; Laidler, D. ; Locorotondo, S. ; Maenhoudt, M. ; Moelants, M. ; Pollentier, I. ; Ronse, K. ; Rooyackers, R. ; Van Aelst, J. ; Vandenberghe, G. ; Vandervorst, W. ; Vandeweyer, T. ; Vanhaelemeersch, S. ; Van Hove, M. ; Van Olmen, J. ; Verhaegen, S. ; Versluijs, J. ; Vrancken, C. ; Wiaux, V. ; Jurczak, M. ; Biesemans, S.IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004, 2004, p.269-272IEEETexto completo disponível |
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2 |
Material Type: Ata de Congresso
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A 0.314μm2 6T-SRAM cell build with tall triple-gate devices for 45nm node applications using 0.75NA 193nm lithographyNACKAENS, A ; ERCKEN, M ; DE MARNEFFE, J. F ; DIXIT, A ; DE MEYER, K ; HENDRICKX, E ; HEYLEN, N ; JAENEN, P ; LAIDLER, D ; LOCOROTONDO, S ; MAENHOUDT, M ; MOELANTS, M ; DEMUYNCK, S ; POLLENTIER, I ; RONSE, K ; ROOYACKERS, R ; VAN AELST, J ; VANDENBERGHE, G ; VANDERVORST, W ; VANDEWEYER, T ; VANHAELEMEERSCH, S ; VAN HOVE, M ; VAN OLMEN, J ; LAUWERS, A ; VERHAEGEN, S ; VERSLUIJS, J ; VRANCKEN, C ; WIAUX, V ; JURCZAK, M ; BIESEMANS, S ; BAERTS, C ; BENDER, H ; BOULAERT, W ; COLLAEN, N ; DEGROOTE, B ; DELVAUX, CPiscataway NJ: IEEE 2004Texto completo disponível |
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3 |
Material Type: Outros
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Adam Smith IIIAntônio Delfim Netto 1928-S.l. s.n 19--Localização: FEA - Fac. Econ. Adm. Contab. e Atuária ACERVO DELFIM NETTO (A6.4.27 )(Acessar) |
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4 |
Material Type: Outros
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Adam Smith IVAntônio Delfim Netto 1928-S.l. s.n 19--Localização: FEA - Fac. Econ. Adm. Contab. e Atuária ACERVO DELFIM NETTO (A6.4.28 )(Acessar) |
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5 |
Material Type: Ata de Congresso
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Advanced process control for hyper-NA lithography based on CD-SEM measurementIshimoto, T ; Sekiguchi, K ; Hasegawa, N ; Maeda, T ; Watanabe, K ; Storms, G ; Laidler, D ; Cheng, SProceedings of SPIE, the International Society for Optical Engineering, 2007, Vol.6518, p.65182P-65182P-11Bellingham, Wash: SPIETexto completo disponível |
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6 |
Material Type: Ata de Congresso
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Advances in process overlayHINNEN, Paul C ; MEGENS, Henry J. L ; VAN DER SCHAAR, Maurits ; VAN HAREN, Richard J. F ; MOS, Evert C ; LALBAHADOERSING, Sanjay ; BORNEBROEK, Frank ; LAIDLER, DavidSPIE proceedings series, 2001, p.114-126Bellingham WA: SPIETexto completo disponível |
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7 |
Material Type: Ata de Congresso
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Advances in process overlay: ATHENA alignment system performance on critical process layersLaidler, David W ; Megens, Henry J. L ; Lalbahadoersing, Sanjay ; van Haren, Richard J. F ; Bornebroek, FrankSPIE proceedings series, 2002, Vol.4689, p.397-408Bellingham WA: SPIETexto completo disponível |
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8 |
Material Type: Artigo
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AGN Host Galaxies at z ~ 0.4-1.3: Bulge-dominated and Lacking Merger-AGN ConnectionGrogin, N. A ; Conselice, C. J ; Chatzichristou, E ; Alexander, D. M ; Bauer, F. E ; Hornschemeier, A. E ; Jogee, S ; Koekemoer, A. M ; Laidler, V. G ; Livio, M ; Lucas, R. A ; Paolillo, M ; Ravindranath, S ; Schreier, E. J ; Simmons, B. D ; Urry, C. MThe Astrophysical journal, 2005-07, Vol.627 (2), p.L97-L100 [Periódico revisado por pares]Chicago, IL: IOP PublishingTexto completo disponível |
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9 |
Material Type: Artigo
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AGN Host Galaxies at z 6 0.4-1.3: Bulge-dominated and Lacking Merger-AGN ConnectionGrogin, NA ; Conselice, C J ; Chatzichristou, E ; Alexander, D M ; Bauer, F E ; Hornschemeier, A E ; Jogee, S ; Koekemoer, A M ; Laidler, V G ; Livio, M ; Lucas, R A ; Paolillo, M ; Ravindranath, S ; Schreier, E JThe Astrophysical journal, 2005-07, Vol.627 (2), p.L97-L100 [Periódico revisado por pares]Texto completo disponível |
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10 |
Material Type: Artigo
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AGN Host Galaxies at z~0.4-1.3 : Bulge-dominated and Lacking Merger-AGN ConnectionGrogin, N. A ; Conselice, C. J ; Chatzichristou, E ; Alexander, D. M ; Bauer, F. E ; Hornschemeier, A. E ; Jogee, S ; Koekemoer, A. M ; Laidler, V. G ; Livio, M ; Lucas, R. A ; Paolillo, M ; Ravindranath, S ; Schreier, E. J ; Simmons, B. D ; Urry, C. M2005-07Texto completo disponível |