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1
Enterprise Tomography Driven Integration Lifecycle Management of Federated ERP in Green Clouds
Enterprise Tomography Driven Integration Lifecycle Management of Federated ERP in Green Clouds
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Enterprise Tomography Driven Integration Lifecycle Management of Federated ERP in Green Clouds

Aalmink, Jan ; Gómez, Jorge Marx ; Schubert, André Trigo, António ; Cruz-Cunha, Maria Manuela ; Quintela Varajão, João Eduardo ; Putnik, Goran D.

ENTERprise Information Systems, p.1-9 [Periódico revisado por pares]

Berlin, Heidelberg: Springer Berlin Heidelberg

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2
Incidence of Phytophthora fruit rot on four durian cultivars in Davao City, Philippines
Incidence of Phytophthora fruit rot on four durian cultivars in Davao City, Philippines
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Incidence of Phytophthora fruit rot on four durian cultivars in Davao City, Philippines

Abad, R.G ; Cruz, K.J.T

Acta horticulturae, 2013 (1006), p.35-39 [Periódico revisado por pares]

International Society for Horticultural Science

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3
Detection of stator and rotor faults in a DFIG based on the stator reactive power analysis
Detection of stator and rotor faults in a DFIG based on the stator reactive power analysis
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Detection of stator and rotor faults in a DFIG based on the stator reactive power analysis

Abadi, M. B. ; Cruz, S. M. A. ; Goncalves, A. P. ; Goncalves, P. F. C. ; Mendes, A. M. S. ; Ribeiro, A. ; Silva, F.

IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society, 2014, p.2037-2043

IEEE

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4
Three-level NPC inverter fault diagnosis by the Average Current Park's Vector approach
Three-level NPC inverter fault diagnosis by the Average Current Park's Vector approach
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Three-level NPC inverter fault diagnosis by the Average Current Park's Vector approach

Abadi, M. B. ; Mendes, A. M. S. ; Cruz, S. M. A.

2012 XXth International Conference on Electrical Machines, 2012, p.1893-1898

IEEE

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5
Inter-turn fault detection in doubly-fed induction generators for wind turbine applications using the stator reactive power analysis
Inter-turn fault detection in doubly-fed induction generators for wind turbine applications using the stator reactive power analysis
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Inter-turn fault detection in doubly-fed induction generators for wind turbine applications using the stator reactive power analysis

Abadi, M.B ; Cruz, S.M.A ; Gonçalves, A.P ; Mendes, A.M.S ; Ribeiro, A ; Silva, F

3rd Renewable Power Generation Conference (RPG 2014), 2014, p.8.29

Stevenage, UK: IET

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6
UCEFlow: A syntax proposed to structuring the event flow of use cases
UCEFlow: A syntax proposed to structuring the event flow of use cases
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

UCEFlow: A syntax proposed to structuring the event flow of use cases

Aballay, Laura ; Introini, Sabrina Cruz ; Lund, Maria Ines ; Ormeno, Emilio

2013 8th Computing Colombian Conference (8CCC), 2013, p.1-6

IEEE

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7
Development of a Linear Generator With Spring Mechanism for Vortex Bladeless Wind Turbine
Development of a Linear Generator With Spring Mechanism for Vortex Bladeless Wind Turbine
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Development of a Linear Generator With Spring Mechanism for Vortex Bladeless Wind Turbine

Aballe, Alvin Brian D. ; Cruz, Kathrina Yvonne C. ; Rosa, Vincent John H. Dela ; Magwili, Glenn V. ; Ostia, Conrado F.

2020 IEEE 12th International Conference on Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment, and Management (HNICEM), 2020, p.1-6

IEEE

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8
Genetic analysis of selected PSB rice varieties for resistance to bacterial blight (Xanthomonas oryzae pv oryzae ex Ishiyama)
Genetic analysis of selected PSB rice varieties for resistance to bacterial blight (Xanthomonas oryzae pv oryzae ex Ishiyama)
Material Type:
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Genetic analysis of selected PSB rice varieties for resistance to bacterial blight (Xanthomonas oryzae pv oryzae ex Ishiyama)

Abalos, M.C.(Philippines Rice Research Inst., Science City of Munoz, Nueva Ecija (Philippines). Plant Breeding and Biotechnology Div ; Tabien, R.E ; Alfonso, A.A ; Dela Cruz, Q.D

Philippine Journal of Crop Science (Philippines), 2004, Vol.30 (1)

Los Banos, Laguna (Philippines)

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9
Charged kaon production in S-W collisions at 200GeV/c per nucleon
Charged kaon production in S-W collisions at 200GeV/c per nucleon
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Charged kaon production in S-W collisions at 200GeV/c per nucleon

Abatzis, S. ; Andrighetto, A. ; Antinori, F. ; Barnes, R P. ; Bayes, a C. ; Benayoun, M. ; Beusch, W. ; Carney, J N. ; de La Cruz, B. ; Di Bari, D. ; Davies, J P. ; Dufey, J P. ; Elia, D. ; Evans, D. ; Fini, R A. ; French, B R. ; Ghidini, B. ; Helstrup, H. ; Holme, a K. ; Jacholkowski, A. ; Kahane, J. ; Kinson, J B. ; Kirk, A. ; Knudson, K P. ; Lassalle, J C. ; Lenti, V. ; Leruste, P J. ; Manzari, V. ; Navach, F. ; Narjoux, J L. ; Quercigh, E. ; Rossi, L. ; Safarik, K. ; Sene, M. ; Storas, T. ; Vasileiadis, G. ; Villalobos Baillie, O. ; Volte, A. ; Votruba, M F.

Physics Letters B, 1995, Vol.355, p.401-405 [Periódico revisado por pares]

Elsevier

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10
Risk of Training Diagnostic Algorithms on Data with Demographic Bias
Risk of Training Diagnostic Algorithms on Data with Demographic Bias
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Risk of Training Diagnostic Algorithms on Data with Demographic Bias

Abbasi-Sureshjani, Samaneh ; Raumanns, Ralf ; Michels, Britt E. J. ; Schouten, Gerard ; Cheplygina, Veronika Van Nguyen, Hien ; Pereira Amorim, Jose ; Isgum, Ivana ; Cardoso, Jaime ; Jiang, Steve ; Henriques Abreu, Pedro ; Patel, Vishal ; Mateus, Diana ; Cheplygina, Veronika ; Trucco, Emanuele ; Abbasi, Samaneh ; Silva, Wilson ; Luu, Khoa ; Zhou, Kevin ; Cruz, Ricardo ; Le, Ngan ; Heller, Nicholas ; Roysam, Badri ; Sznitman, Raphael

Interpretable and Annotation-Efficient Learning for Medical Image Computing, p.183-192 [Periódico revisado por pares]

Cham: Springer International Publishing

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