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Material Type: Artigo
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MLNet: An multi-scale line detector and descriptor network for 3D reconstructionYang, Jian ; Rao, Yuan ; Cai, Qing ; Rigall, Eric ; Fan, Hao ; Dong, Junyu ; Yu, HuiKnowledge-based systems, 2024-04, Vol.289, p.111476, Article 111476 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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Material Type: Artigo
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Fast and Robust Monocular Visua-Inertial Odometry Using Points and LinesZhang, Ning ; Zhao, YongjiaSensors (Basel, Switzerland), 2019-10, Vol.19 (20), p.4545 [Periódico revisado por pares]Basel: MDPI AGTexto completo disponível |
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Material Type: Artigo
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Neighborhood Feature Line Segment for Image ClassificationJeng-Shyang Pan ; Qingxiang Feng ; Lijun Yan ; Jar-Ferr YangIEEE transactions on circuits and systems for video technology, 2015-03, Vol.25 (3), p.387-398 [Periódico revisado por pares]IEEETexto completo disponível |
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Material Type: Artigo
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Improved Point–Line Visual–Inertial Odometry System Using Helmert Variance Component EstimationXu, Bo ; Chen, Yu ; Zhang, Shoujian ; Wang, JingrongRemote sensing (Basel, Switzerland), 2020-09, Vol.12 (18), p.2901 [Periódico revisado por pares]Basel: MDPI AGTexto completo disponível |
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Material Type: Artigo
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PLD-VINS: RGBD visual-inertial SLAM with point and line featuresZhu, Yeqing ; Jin, Rui ; Lou, Tai-shan ; Zhao, LiangyuAerospace science and technology, 2021-12, Vol.119, p.107185, Article 107185 [Periódico revisado por pares]Elsevier Masson SASTexto completo disponível |
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Material Type: Artigo
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Improved monocular visual-inertial odometry with point and line features using adaptive line feature extractionFeng, Liying ; Zhang, Xiaoli ; Peng, Xiafu ; Zhuang, MingxiMultimedia tools and applications, 2024, Vol.83 (1), p.1481-1512 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
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Material Type: Livro
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Advances in Mobile Mapping TechnologiesNüchter, Andreas ; Lehtola, Ville ; Goulette, FrançoisBasel: MDPI - Multidisciplinary Digital Publishing Institute 2022Texto completo disponível |
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Material Type: Artigo
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Bilinear discriminant feature line analysis for image feature extractionYan, Lijun ; Li, Jun-Bao ; Zhu, Xiaorui ; Pan, Jeng-Shyang ; Tang, LinlinElectronics letters, 2015-02, Vol.51 (4), p.336-338 [Periódico revisado por pares]The Institution of Engineering and TechnologyTexto completo disponível |
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Material Type: Artigo
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Avoiding the interpolation inaccuracy in nearest feature line classifier by spectral feature analysisAltınçay, Hakan ; Erenel, ZaferPattern recognition letters, 2013-09, Vol.34 (12), p.1372-1380 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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Material Type: Artigo
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A measure of average error variance of line featuresLiu, Eryong ; Shi, WenzhongCartography and geographic information science, 2016-08, Vol.43 (4), p.321-327 [Periódico revisado por pares]Taylor & FrancisTexto completo disponível |