Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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Modeling and Architecture Design of Reconfigurable Intelligent Surfaces Using Scattering Parameter Network AnalysisShen, Shanpu ; Clerckx, Bruno ; Murch, RossIEEE transactions on wireless communications, 2022-02, Vol.21 (2), p.1229-1243 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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2 |
Material Type: Artigo
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Predicting the Bistatic Scattering of a Multiport Loaded Structure Under Arbitrary Excitation: The S-Parameters ApproachKuznetsov, Aleksandr D. ; Holopainen, Jari ; Viikari, VilleIEEE transactions on antennas and propagation, 2024-08, Vol.72 (8), p.6691-6701 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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A Universal and Efficient Approach to Analysis the Reconfigurable Metasurface for Complex SituationYang, Jin ; Ke, Jun Chen ; Wu, Jun Wei ; Liang, Jing Cheng ; Cui, Mian ; Wang, Meng ; Zhang, ChengIEEE antennas and wireless propagation letters, 2024-07, p.1-5IEEETexto completo disponível |
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4 |
Material Type: Artigo
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A Novel Method A Novel Method A Novel Method for Estimating Residual Model Parameters to Evaluate Uncertainty in Scattering Parameter MeasurementsCho, Chihyun ; Kang, Tae-Weon ; Kwon, Jae-Yong ; Koo, HyunjiIEEE transactions on instrumentation and measurement, 2022, p.1-1 [Periódico revisado por pares]IEEETexto completo disponível |
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5 |
Material Type: Artigo
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The Relationship Between Switch-Term-Corrected Scattering-Parameters and Wave-Parameters Measured With a Two-Port Vector Network AnalyzerJargon, Jeffrey A. ; Williams, Dylan F. ; Sanders, AricIEEE microwave and wireless components letters, 2018-10, Vol.28 (10), p.951-953 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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6 |
Material Type: Artigo
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Calibration on the Fly-A Novel Two-Port S-Parameter Measurement Method for On-Wafer Leaky SystemsWu, Aihua ; Liu, Chen ; Liang, Faguo ; Zou, Xuefeng ; Wang, Yibang ; Luan, Peng ; Li, Chong ; Ridler, NickIEEE transactions on microwave theory and techniques, 2020-08, Vol.68 (8), p.3558-3564 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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7 |
Material Type: Artigo
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An Embedded Common-Mode Filter and Mixed-Mode Scattering Parameters for the MIPI C-PHY InterfaceChien, Yung-Chi ; Liu, Hsu-Wei ; Chou, Chiu-Chih ; Wu, Tzong-LinIEEE transactions on electromagnetic compatibility, 2024-02, Vol.66 (1), p.143-152 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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8 |
Material Type: Artigo
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Detection of Series Faults in High-Temperature Superconducting DC Power Cables Using Machine LearningChoi, Jeong H. ; Park, Chanyeop ; Cheetham, Peter ; Kim, Chul H. ; Pamidi, Sastry ; Graber, LukasIEEE transactions on applied superconductivity, 2021-08, Vol.31 (5), p.1-9 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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9 |
Material Type: Artigo
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Introducing a Mixed-Mode Matrix for Investigation of Wireless Communication Related to Orbital Angular MomentumPark, Woocheon ; Wang, Lei ; Bruns, Heinz-Dietrich ; Kam, Dong Gun ; Schuster, ChristianIEEE transactions on antennas and propagation, 2019-03, Vol.67 (3), p.1719-1728 [Periódico revisado por pares]IEEETexto completo disponível |
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10 |
Material Type: Artigo
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Photonic Network Analyzer Based on Optical SamplingDing, Min ; Jin, Zhengtao ; Chen, Jianping ; Wu, GuilingIEEE photonics technology letters, 2020-02, Vol.32 (4), p.212-215New York: IEEETexto completo disponível |