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Adsorption, self-assembly and self-metalation of tetra-cyanophenyl porphyrins on semiconducting CoO(100) films
Adsorption, self-assembly and self-metalation of tetra-cyanophenyl porphyrins on semiconducting CoO(100) films
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Adsorption, self-assembly and self-metalation of tetra-cyanophenyl porphyrins on semiconducting CoO(100) films

Ammon, Maximilian ; Raabgrund, Andreas ; Schneider, M. Alexander

Surface science, 2022-06, Vol.720, p.122044, Article 122044 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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2
Electric field strength-dependent accuracy of TiAlN thin film composition measurements by laser-assisted atom probe tomography
Electric field strength-dependent accuracy of TiAlN thin film composition measurements by laser-assisted atom probe tomography
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Electric field strength-dependent accuracy of TiAlN thin film composition measurements by laser-assisted atom probe tomography

Hans, Marcus ; Schneider, Jochen M

New journal of physics, 2020-03, Vol.22 (3), p.33036 [Periódico revisado por pares]

Bristol: IOP Publishing

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3
Piezoelectricity in Y0.09Al0.91N thin films
Piezoelectricity in Y0.09Al0.91N thin films
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Piezoelectricity in Y0.09Al0.91N thin films

Schlögl, M. ; Schneider, M. ; Schmid, U.

Materials science & engineering. B, Solid-state materials for advanced technology, 2022-02, Vol.276, p.1, Article 115543 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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4
Combinatorial evaluation of phase formation and magnetic properties of FeMnCoCrAl high entropy alloy thin film library
Combinatorial evaluation of phase formation and magnetic properties of FeMnCoCrAl high entropy alloy thin film library
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Combinatorial evaluation of phase formation and magnetic properties of FeMnCoCrAl high entropy alloy thin film library

Marshal, A ; Pradeep, K G ; Music, D ; Wang, L ; Petracic, O ; Schneider, J M

Scientific reports, 2019-05, Vol.9 (1), p.7864-7864, Article 7864 [Periódico revisado por pares]

England: Nature Publishing Group

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5
Atomistic structures of 〈0001〉 tilt grain boundaries in a textured Mg thin film
Atomistic structures of 〈0001〉 tilt grain boundaries in a textured Mg thin film
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Atomistic structures of 〈0001〉 tilt grain boundaries in a textured Mg thin film

Zhang, Siyuan ; Xie, Zhuocheng ; Keuter, Philipp ; Ahmad, Saba ; Abdellaoui, Lamya ; Zhou, Xuyang ; Cautaerts, Niels ; Breitbach, Benjamin ; Aliramaji, Shamsa ; Korte-Kerzel, Sandra ; Hans, Marcus ; Schneider, Jochen M ; Scheu, Christina

Nanoscale, 2022-12, Vol.14 (48), p.18192-18199 [Periódico revisado por pares]

Cambridge: Royal Society of Chemistry

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6
3D characterisation of piezoelectric bistable MEMS membranes during switching
3D characterisation of piezoelectric bistable MEMS membranes during switching
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3D characterisation of piezoelectric bistable MEMS membranes during switching

Dorfmeister, M. ; Schneider, M. ; Schmid, U.

Sensors and actuators. A. Physical., 2019-10, Vol.298, p.111576, Article 111576 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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7
Accuracy and precision of resonant piezoelectric MEMS viscosity sensors in highly viscous bituminous materials
Accuracy and precision of resonant piezoelectric MEMS viscosity sensors in highly viscous bituminous materials
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Accuracy and precision of resonant piezoelectric MEMS viscosity sensors in highly viscous bituminous materials

Alasatri, S. ; Schneider, M. ; Mirwald, J. ; Hofko, B. ; Schmid, U.

Sensors and actuators. A. Physical., 2022-11, Vol.347, p.113903, Article 113903 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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8
Scaling and Confinement in Ultrathin Chalcogenide Films as Exemplified by GeTe
Scaling and Confinement in Ultrathin Chalcogenide Films as Exemplified by GeTe
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Scaling and Confinement in Ultrathin Chalcogenide Films as Exemplified by GeTe

Kerres, Peter ; Zhou, Yiming ; Vaishnav, Hetal ; Raghuwanshi, Mohit ; Wang, Jiangjing ; Häser, Maria ; Pohlmann, Marc ; Cheng, Yudong ; Schön, Carl‐Friedrich ; Jansen, Thomas ; Bellin, Christophe ; Bürgler, Daniel E. ; Jalil, Abdur Rehman ; Ringkamp, Christoph ; Kowalczyk, Hugo ; Schneider, Claus M. ; Shukla, Abhay ; Wuttig, Matthias

Small (Weinheim an der Bergstrasse, Germany), 2022-05, Vol.18 (21), p.e2201753-n/a [Periódico revisado por pares]

Germany: Wiley Subscription Services, Inc

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9
CALPHAD-Based Modelling of the Temperature-Composition-Structure Relationship during Physical Vapor Deposition of Mg-Ca Thin Films
CALPHAD-Based Modelling of the Temperature-Composition-Structure Relationship during Physical Vapor Deposition of Mg-Ca Thin Films
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CALPHAD-Based Modelling of the Temperature-Composition-Structure Relationship during Physical Vapor Deposition of Mg-Ca Thin Films

Keuter, Philipp ; To Baben, Moritz ; Aliramaji, Shamsa ; Schneider, Jochen M

Materials, 2023-03, Vol.16 (6), p.2417 [Periódico revisado por pares]

Switzerland: MDPI AG

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10
Impact of annealing temperature on the mechanical and electrical properties of sputtered aluminum nitride thin films
Impact of annealing temperature on the mechanical and electrical properties of sputtered aluminum nitride thin films
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Impact of annealing temperature on the mechanical and electrical properties of sputtered aluminum nitride thin films

Gillinger, M. ; Schneider, M. ; Bittner, A. ; Nicolay, P. ; Schmid, U.

Journal of applied physics, 2015-02, Vol.117 (6) [Periódico revisado por pares]

Melville: American Institute of Physics

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