Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Orientation and phase mapping in the transmission electron microscope using precession‐assisted diffraction spot recognition: state‐of‐the‐art resultsVILADOT, D. ; VÉRON, M. ; GEMMI, M. ; PEIRÓ, F. ; PORTILLO, J. ; ESTRADÉ, S. ; MENDOZA, J. ; LLORCA‐ISERN, N. ; NICOLOPOULOS, S.Journal of microscopy (Oxford), 2013-10, Vol.252 (1), p.23-34 [Periódico revisado por pares]England: Wiley Subscription Services, IncTexto completo disponível |
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2 |
Material Type: Artigo
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Designing L21-strengthened Al-Cr-Fe-Ni-Ti complex concentrated alloys for high temperature applicationsKim, Woo Chul ; Na, Min Young ; Kwon, Heoun Jun ; Na, Young Sang ; Won, Jong Woo ; Chang, Hye Jung ; Lim, Ka RamActa materialia, 2021-06, Vol.211, Article 116890 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
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3 |
Material Type: Artigo
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Specifics of the data processing of precession electron diffraction tomography data and their implementation in the program PETS2.0Palatinus, Lukáš ; Brázda, Petr ; Jelínek, Martin ; Hrdá, Jaromíra ; Steciuk, Gwladys ; Klementová, MarianaActa crystallographica Section B, Structural science, crystal engineering and materials, 2019-08, Vol.75 (4), p.512-522 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of CrystallographyTexto completo disponível |
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4 |
Material Type: Artigo
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Interfacial Microstructure Analysis for the Development of Brazing Technology Between Dissimilar MaterialsNOGAWA, TakashiJOURNAL OF THE JAPAN WELDING SOCIETY, 2023, Vol.92(7), pp.466-470Tokyo: JAPAN WELDING SOCIETYTexto completo disponível |
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5 |
Material Type: Artigo
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On recrystallization of the α and β phases in titanium alloysBalachandran, Shanoob ; Kumar, Sharath ; Banerjee, DipankarActa materialia, 2017-06, Vol.131, p.423-434 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
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6 |
Material Type: Artigo
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Development and application of a novel precession electron diffraction technique to quantify and map deformation structures in highly deformed materials—as applied to ultrafine-grained titaniumGhamarian, Iman ; Liu, Yue ; Samimi, Peyman ; Collins, Peter C.Acta materialia, 2014-10, Vol.79, p.203-215 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
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7 |
Material Type: Artigo
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Free, flexible and fast: Orientation mapping using the multi-core and GPU-accelerated template matching capabilities in the Python-based open source 4D-STEM analysis toolbox PyxemCautaerts, Niels ; Crout, Phillip ; Ånes, Håkon W. ; Prestat, Eric ; Jeong, Jiwon ; Dehm, Gerhard ; Liebscher, Christian H.Ultramicroscopy, 2022-07, Vol.237, p.113517-113517, Article 113517 [Periódico revisado por pares]Netherlands: Elsevier B.VTexto completo disponível |
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8 |
Material Type: Artigo
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The failure mechanism at adiabatic shear bands of titanium alloy: High-precision survey using precession electron diffraction and geometrically necessary dislocation density calculationLiu, Xin ; Zhou, Yu ; Zhu, Xinjie ; Wang, Duoduo ; Fan, QunboMaterials science & engineering. A, Structural materials : properties, microstructure and processing, 2019-02, Vol.746, p.322-331 [Periódico revisado por pares]Lausanne: Elsevier B.VTexto completo disponível |
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9 |
Material Type: Artigo
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A method for crystallographic mapping of an alpha-beta titanium alloy with nanometre resolution using scanning precession electron diffraction and open-source software librariesMacLaren, Ian ; Frutos-Myro, Enrique ; Zeltmann, Steven ; Ophus, ColinJournal of microscopy (Oxford), 2024-02 [Periódico revisado por pares]England: WileyTexto completo disponível |
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10 |
Material Type: Artigo
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Outgassing of implanted He via short circuit transport along phase and grain boundaries in vapor co-deposited Cu-W nanocompositesYadav, Digvijay ; Chen, Peng ; Xiang, Sisi ; Wang, Yongqiang ; Baldwin, Jon Kevin ; Evans, Peter ; Williams, Nicholas ; Demkowicz, Michael J. ; Xie, Kelvin Y.Acta materialia, 2022-08, Vol.240 [Periódico revisado por pares]United States: ElsevierTexto completo disponível |