Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Polarization-induced remote interfacial charge scattering in Al2O3/AlGaN/GaN double heterojunction high electron mobility transistorsJi, Dong ; Liu, Bing ; Lu, Yanwu ; Liu, Guipeng ; Zhu, Qinsheng ; Wang, ZhanguoApplied physics letters, 2012-03, Vol.100 (13) [Periódico revisado por pares]Texto completo disponível |
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2 |
Material Type: Artigo
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Determination of the valence band offset of wurtzite InN∕ZnO heterojunction by x-ray photoelectron spectroscopyZhang, Riqing ; Zhang, Panfeng ; Kang, Tingting ; Fan, Haibo ; Liu, Xianglin ; Yang, Shaoyan ; Wei, Hongyuan ; Zhu, Qinsheng ; Wang, ZhanguoApplied physics letters, 2007-10, Vol.91 (16) [Periódico revisado por pares]United StatesTexto completo disponível |
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3 |
Material Type: Artigo
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Interfacial misfit dislocation scattering effect in two-dimensional electron gas channel of GaN heterojunctionLiu, Bing ; Lu, Yanwu ; Huang, Yan ; Liu, Guipeng ; Zhu, Qinsheng ; Wang, ZhanguoPhysics letters. A, 2012-02, Vol.376 (10-11), p.1067-1071 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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4 |
Material Type: Artigo
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Dielectric and barrier thickness fluctuation scattering in Al2O3/AlGaN/GaN double heterojunction high-electron mobility transistorsJi, Dong ; Lu, Yanwu ; Liu, Bing ; Liu, Guipeng ; Zhu, Qinsheng ; Wang, ZhanguoThin solid films, 2013-05, Vol.534, p.655-658 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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5 |
Material Type: Artigo
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Study of the one dimensional electron gas arrays confined by steps in vicinal GaN/AlGaN heterointerfacesLi, Huijie ; Zhao, Guijuan ; Liu, Guipeng ; Wei, Hongyuan ; Jiao, Chunmei ; Yang, Shaoyan ; Wang, Lianshan ; Zhu, QinshengJournal of applied physics, 2014-05, Vol.115 (19) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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6 |
Material Type: Artigo
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Influence of band bending and polarization on the valence band offset measured by x-ray photoelectron spectroscopyXu, Xiaoqing ; Liu, Xianglin ; Guo, Yan ; Wang, Jun ; Song, Huaping ; Yang, Shaoyan ; Wei, Hongyuan ; Zhu, Qinsheng ; Wang, ZhanguoJournal of applied physics, 2010-05, Vol.107 (10), p.104510-104510-6 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
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7 |
Material Type: Artigo
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Determination of polar C-plane and nonpolar A-plane AlN/GaN heterojunction band offsets by X-ray photoelectron spectroscopyLi, Huijie ; Liu, Xianglin ; Sang, Ling ; Wang, Jianxia ; Jin, Dongdong ; Zhang, Heng ; Yang, Shaoyan ; Liu, Shuman ; Mao, Wei ; Hao, Yue ; Zhu, Qinsheng ; Wang, ZhanguoPhysica Status Solidi. B: Basic Solid State Physics, 2014-04, Vol.251 (4), p.788-791 [Periódico revisado por pares]Blackwell Publishing LtdTexto completo disponível |
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8 |
Material Type: Artigo
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Growth of a-plane GaN on r-plane sapphire by self-patterned nanoscale epitaxial lateral overgrowthLi, Zhiwei ; Wei, Hongyuan ; Xu, Xiaoqing ; Zhao, Guijuan ; Liu, Xianglin ; Yang, Shaoyan ; Zhu, Qinsheng ; Wang, ZhanguoJournal of crystal growth, 2012-06, Vol.348 (1), p.10-14 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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9 |
Material Type: Artigo
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Scattering due to Schottky barrier height spatial fluctuation on two dimensional electron gas in AlGaN/GaN high electron mobility transistorsLi, Huijie ; Liu, Guipeng ; Wei, Hongyuan ; Jiao, Chunmei ; Wang, Jianxia ; Zhang, Heng ; Dong Jin, Dong ; Feng, Yuxia ; Yang, Shaoyan ; Wang, Lianshan ; Zhu, Qinsheng ; Wang, Zhan-GuoApplied physics letters, 2013-12, Vol.103 (23) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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10 |
Material Type: Artigo
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Theoretical calculation of the interfacial charge-modulated two-dimensional electron gas mobility in Al2O3/AlGaN/GaN double heterojunction high-electron mobility transistorsJi, Dong ; Lu, Yanwu ; Liu, Bing ; Liu, Guipeng ; Zhu, Qinsheng ; Wang, ZhanguoSolid state communications, 2013-01, Vol.153 (1), p.53-57 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |