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Advanced analysis of copper X‐ray photoelectron spectra
Advanced analysis of copper X‐ray photoelectron spectra
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Advanced analysis of copper X‐ray photoelectron spectra

Biesinger, Mark C.

Surface and interface analysis, 2017-12, Vol.49 (13), p.1325-1334 [Periódico revisado por pares]

Bognor Regis: Wiley Subscription Services, Inc

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A general overview and comparative interpretation on element‐specific X‐ray spectroscopy techniques: XPS, XAS, and XRS
A general overview and comparative interpretation on element‐specific X‐ray spectroscopy techniques: XPS, XAS, and XRS
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A general overview and comparative interpretation on element‐specific X‐ray spectroscopy techniques: XPS, XAS, and XRS

Ketenoglu, Didem

X-ray spectrometry, 2022-09, Vol.51 (5-6), p.422-443 [Periódico revisado por pares]

Chichester, UK: John Wiley & Sons, Inc

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Direct determination of Mn valence states in mixed‐valent manganates by photoluminescence spectroscopy
Direct determination of Mn valence states in mixed‐valent manganates by photoluminescence spectroscopy
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Direct determination of Mn valence states in mixed‐valent manganates by photoluminescence spectroscopy

Chakrapani, Vidhya ; Wang, Chenying ; Wang, Qi ; Smieszek, Nicholas

Surface and interface analysis, 2022-12, Vol.54 (12), p.1192-1202 [Periódico revisado por pares]

Bognor Regis: Wiley Subscription Services, Inc

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4
Oxidative functionalization of carbon nanotubes in atmospheric pressure filamentary dielectric barrier discharge (APDBD)
Oxidative functionalization of carbon nanotubes in atmospheric pressure filamentary dielectric barrier discharge (APDBD)
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Oxidative functionalization of carbon nanotubes in atmospheric pressure filamentary dielectric barrier discharge (APDBD)

Okpalugo, T.I.T. ; Papakonstantinou, P. ; Murphy, H. ; Mclaughlin, J. ; Brown, N.M.D

Carbon (New York), 2005-11, Vol.43 (14), p.2951-2959 [Periódico revisado por pares]

Oxford: Elsevier Ltd

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5
Insight note: X‐ray photoelectron spectroscopy (XPS) peak fitting of the Al 2p peak from electrically isolated aluminum foil with an oxide layer
Insight note: X‐ray photoelectron spectroscopy (XPS) peak fitting of the Al 2p peak from electrically isolated aluminum foil with an oxide layer
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Insight note: X‐ray photoelectron spectroscopy (XPS) peak fitting of the Al 2p peak from electrically isolated aluminum foil with an oxide layer

Lizarbe, Alvaro J. ; Major, George H. ; Fernandez, Vincent ; Fairley, Neal ; Linford, Matthew R.

Surface and interface analysis, 2023-09, Vol.55 (9), p.651-657 [Periódico revisado por pares]

Bognor Regis: Wiley Subscription Services, Inc

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6
Effects of post‐deposition annealing on chemical composition of SiNx film in SiO2/SiNx/SiO2/Si stacked structure
Effects of post‐deposition annealing on chemical composition of SiNx film in SiO2/SiNx/SiO2/Si stacked structure
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Effects of post‐deposition annealing on chemical composition of SiNx film in SiO2/SiNx/SiO2/Si stacked structure

Sakata, Tomohiro ; Ogawa, Shingo ; Inoue, Keiko ; Shimizu, Yumiko ; Tanahashi, Yusaku

Surface and interface analysis, 2022-06, Vol.54 (6), p.661-666 [Periódico revisado por pares]

Bognor Regis: Wiley Subscription Services, Inc

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7
A Review of X-ray Photoelectron Spectroscopy Technique to Analyze the Stability and Degradation Mechanism of Solid Oxide Fuel Cell Cathode Materials
A Review of X-ray Photoelectron Spectroscopy Technique to Analyze the Stability and Degradation Mechanism of Solid Oxide Fuel Cell Cathode Materials
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A Review of X-ray Photoelectron Spectroscopy Technique to Analyze the Stability and Degradation Mechanism of Solid Oxide Fuel Cell Cathode Materials

Anwar, Mustafa ; Shaikh Abdul, Muhammed Ali ; Khan, Uneeb Masood ; Hassan, Muhammad ; Khoja, Asif Hussain ; Muchtar, Andanastuti

Materials, 2022-03, Vol.15 (7), p.2540 [Periódico revisado por pares]

Switzerland: MDPI AG

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8
Combined analysis methods for investigating titanium and nickel surface contamination after plasma deep etching
Combined analysis methods for investigating titanium and nickel surface contamination after plasma deep etching
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Combined analysis methods for investigating titanium and nickel surface contamination after plasma deep etching

Ettouri, Rim ; Tillocher, Thomas ; Lefaucheux, Philippe ; Boutaud, Bertrand ; Fernandez, Vincent ; Fairley, Neal ; Cardinaud, Christophe ; Girard, Aurélie ; Dussart, Rémi

Surface and interface analysis, 2022-02, Vol.54 (2), p.134-147 [Periódico revisado por pares]

Bognor Regis: Wiley Subscription Services, Inc

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9
GDOES, XPS, and SEM with EDS analysis of porous coatings obtained on titanium after plasma electrolytic oxidation
GDOES, XPS, and SEM with EDS analysis of porous coatings obtained on titanium after plasma electrolytic oxidation
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GDOES, XPS, and SEM with EDS analysis of porous coatings obtained on titanium after plasma electrolytic oxidation

Rokosz, Krzysztof ; Hryniewicz, Tadeusz ; Raaen, Steinar ; Chapon, Patrick ; Dudek, Łukasz

Surface and interface analysis, 2017-04, Vol.49 (4), p.303-315 [Periódico revisado por pares]

Bognor Regis: Wiley Subscription Services, Inc

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10
In Situ Observation of Surface Species on Iridium Oxide Nanoparticles during the Oxygen Evolution Reaction
In Situ Observation of Surface Species on Iridium Oxide Nanoparticles during the Oxygen Evolution Reaction
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In Situ Observation of Surface Species on Iridium Oxide Nanoparticles during the Oxygen Evolution Reaction

Sanchez Casalongue, Hernan G. ; Ng, May Ling ; Kaya, Sarp ; Friebel, Daniel ; Ogasawara, Hirohito ; Nilsson, Anders

Angewandte Chemie (International ed.), 2014-07, Vol.53 (28), p.7169-7172 [Periódico revisado por pares]

Weinheim: WILEY-VCH Verlag

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