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1 |
Material Type: Livro
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Fundamentals of Computation Theory: 22nd International Symposium, FCT 2019, Copenhagen, Denmark, August 12-14, 2019, ProceedingsGąsieniec, Leszek Antoni ; Jansson, Jesper ; Levcopoulos, ChristosCham: Springer International Publishing 2020Sem texto completo |
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2 |
Material Type: Artigo
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Human3.6M: Large Scale Datasets and Predictive Methods for 3D Human Sensing in Natural EnvironmentsIonescu, Catalin ; Papava, Dragos ; Olaru, Vlad ; Sminchisescu, CristianIEEE transactions on pattern analysis and machine intelligence, 2014-07, Vol.36 (7), p.1325-1339 [Periódico revisado por pares]Los Alamitos, CA: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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Quantitative analysis of molecular surfaces: areas, volumes, electrostatic potentials and average local ionization energiesBulat, Felipe A. ; Toro-Labbé, Alejandro ; Brinck, Tore ; Murray, Jane S. ; Politzer, PeterJournal of molecular modeling, 2010-11, Vol.16 (11), p.1679-1691 [Periódico revisado por pares]Berlin/Heidelberg: Springer-VerlagTexto completo disponível |
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4 |
Material Type: Artigo
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Recent developments in the ABINIT software packageGonze, X. ; Jollet, F. ; Abreu Araujo, F. ; Adams, D. ; Amadon, B. ; Applencourt, T. ; Audouze, C. ; Beuken, J.-M. ; Bieder, J. ; Bokhanchuk, A. ; Bousquet, E. ; Bruneval, F. ; Caliste, D. ; Côté, M. ; Dahm, F. ; Da Pieve, F. ; Delaveau, M. ; Di Gennaro, M. ; Dorado, B. ; Espejo, C. ; Geneste, G. ; Genovese, L. ; Gerossier, A. ; Giantomassi, M. ; Gillet, Y. ; Hamann, D.R. ; He, L. ; Jomard, G. ; Laflamme Janssen, J. ; Le Roux, S. ; Levitt, A. ; Lherbier, A. ; Liu, F. ; Lukačević, I. ; Martin, A. ; Martins, C. ; Oliveira, M.J.T. ; Poncé, S. ; Pouillon, Y. ; Rangel, T. ; Rignanese, G.-M. ; Romero, A.H. ; Rousseau, B. ; Rubel, O. ; Shukri, A.A. ; Stankovski, M. ; Torrent, M. ; Van Setten, M.J. ; Van Troeye, B. ; Verstraete, M.J. ; Waroquiers, D. ; Wiktor, J. ; Xu, B. ; Zhou, A. ; Zwanziger, J.W.Computer physics communications, 2016-08, Vol.205, p.106-131 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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5 |
Material Type: Artigo
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RICOPILI: Rapid Imputation for COnsortias PIpeLIneLam, Max ; Awasthi, Swapnil ; Watson, Hunna J ; Goldstein, Jackie ; Panagiotaropoulou, Georgia ; Trubetskoy, Vassily ; Karlsson, Robert ; Frei, Oleksander ; Fan, Chun-Chieh ; De Witte, Ward ; Mota, Nina R ; Mullins, Niamh ; Brügger, Kim ; Lee, S Hong ; Wray, Naomi R ; Skarabis, Nora ; Huang, Hailiang ; Neale, Benjamin ; Daly, Mark J ; Mattheisen, Manuel ; Walters, Raymond ; Ripke, Stephan Schwartz, RussellBioinformatics, 2020-02, Vol.36 (3), p.930-933 [Periódico revisado por pares]England: Oxford University PressTexto completo disponível |
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6 |
Material Type: Artigo
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Analysing high-throughput sequencing data in Python with HTSeq 2.0Putri, Givanna H ; Anders, Simon ; Pyl, Paul Theodor ; Pimanda, John E ; Zanini, Fabio Boeva, ValentinaBioinformatics, 2022-05, Vol.38 (10), p.2943-2945 [Periódico revisado por pares]England: Oxford University PressTexto completo disponível |
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7 |
Material Type: Artigo
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Affordances, experimentation and actualization of FinTech: A blockchain implementation studyDu, Wenyu (Derek) ; Pan, Shan L. ; Leidner, Dorothy E. ; Ying, WenchiThe journal of strategic information systems, 2019-03, Vol.28 (1), p.50-65 [Periódico revisado por pares]Kidlington: Elsevier B.VTexto completo disponível |
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8 |
Material Type: Artigo
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Software product line testing – A systematic mapping studyEngström, Emelie ; Runeson, PerInformation and software technology, 2011, Vol.53 (1), p.2-13 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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9 |
Material Type: Artigo
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Near-optimal Lower Bounds on Quantifier Depth and Weisfeiler–Leman Refinement StepsBerkholz, Christoph ; Nordström, JakobJournal of the ACM, 2023-10, Vol.70 (5), p.1-32, Article 32 [Periódico revisado por pares]New York, NY: ACMTexto completo disponível |
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10 |
Material Type: Artigo
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Safety Poka Yoke in Zero-Defect Manufacturing Based on Digital TwinsLv, Zhihan ; Guo, Jinkang ; Lv, HaibinIEEE transactions on industrial informatics, 2023-02, Vol.19 (2), p.1176-1184Piscataway: IEEETexto completo disponível |