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Influence of Beam Conditions and Energy for SEE Testing
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Influence of Beam Conditions and Energy for SEE Testing

Ferlet-Cavrois, Veronique ; Schwank, James R. ; Liu, Sandra ; Muschitiello, Michele ; Beutier, Thierry ; Javanainen, Arto ; Hedlund, Alex ; Poivey, Christian ; Mohammadzadeh, Ali ; Harboe-Sorensen, Reno ; Santin, Giovanni ; Nickson, Bob ; Menicucci, Alessandra ; Binois, Christian ; Peyre, Daniel ; Hoeffgen, Stefan Klaus ; Metzger, Stefan ; Schardt, Dieter ; Kettunen, Heikki ; Virtanen, Ari ; Berger, Guy ; Piquet, Bruno ; Foy, Jean-Claude ; Zafrani, Max ; Truscott, Pete ; Poizat, Marc ; Bezerra, Francoise

IEEE transactions on nuclear science, 2012-08, Vol.59 (4), p.1149-1160 [Periódico revisado por pares]

New York: IEEE

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Influence of beam conditions and energy for SEE testing
Material Type:
Artigo
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Influence of beam conditions and energy for SEE testing

Ferlet-Cavrois, V ; Schwank, J.R ; Liu, S ; Muschitiello, M ; Beutier, T ; Javanainen, A ; Hedlund, A ; Poivey, C ; Mohammadzadeh, Ali ; Harboe-Sorensen, Reno ; Santin, Giovanni ; Nickson, Bob ; Menicucci, A ; Binois, C ; Peyre, D ; Höffgen, Stefan Klaus ; Metzger, Stefan ; Schardt, D ; Kettunen, H ; Virtanen, A ; Berger, G ; Piquet, B ; Foy, J.-C ; Zafrani, M ; Truscott, P ; Poizat, M ; Bezerra, F

2012

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Influence of beam conditions and energy for SEE testing
Material Type:
Ata de Congresso
Adicionar ao Meu Espaço

Influence of beam conditions and energy for SEE testing

Ferlet-Cavrois, V. ; Schwank, J. R. ; Liu, S. ; Muschitiello, M. ; Beutier, T. ; Javanainen, A. ; Hedlund, A. ; Poivey, C. ; Zadeh, A. ; Harboe-Sorensen, R. ; Santin, G. ; Nickson, B. ; Menicucci, A. ; Binois, C. ; Peyre, D. ; Hoeffgen, S. K. ; Metzger, S. ; Schardt, D. ; Kettunen, H. ; Virtanen, A. ; Berger, G. ; Piquet, B. ; Foy, J. ; Zafrani, M. ; Truscott, P. ; Poizat, M. ; Bezerra, F.

2011 12th European Conference on Radiation and Its Effects on Components and Systems, 2011, Vol.J-1, p.690-699

IEEE

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