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Lossless and near-lossless image compression with color transformations
Lossless and near-lossless image compression with color transformations
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Ata de Congresso 		Adicionar ao Meu Espaço

Lossless and near-lossless image compression with color transformations

Domanski, M. ; Rakowski, K.

Proceedings 2001 International Conference on Image Processing (Cat. No.01CH37205), 2001, Vol.3, p.454-457 vol.3

IEEE

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2
300-mm Monolithic Silicon Photonics Foundry Technology
300-mm Monolithic Silicon Photonics Foundry Technology
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Artigo 		Adicionar ao Meu Espaço

300-mm Monolithic Silicon Photonics Foundry Technology

Giewont, Ken ; Hu, Shuren ; Peng, Bo ; Rakowski, Michal ; Rauch, Stewart ; Rosenberg, Jessie C. ; Sahin, Asli ; Stobert, Ian ; Stricker, Andy ; Nummy, Karen ; Anderson, Frederick A. ; Ayala, Javier ; Barwicz, Tymon ; Bian, Yusheng ; Dezfulian, Kevin K. ; Gill, Douglas M. ; Houghton, Thomas

IEEE journal of selected topics in quantum electronics, 2019-09, Vol.25 (5), p.1-11 [Periódico revisado por pares]

New York: IEEE

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3
Deep Subwavelength Anti-Slot Photonic Crystals Fabricated in Monolithic Silicon Photonics Technology
Deep Subwavelength Anti-Slot Photonic Crystals Fabricated in Monolithic Silicon Photonics Technology
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Artigo 		Adicionar ao Meu Espaço

Deep Subwavelength Anti-Slot Photonic Crystals Fabricated in Monolithic Silicon Photonics Technology

Allen, J. A. ; Arnold, K. P. ; Halimi, S. I. ; Ryder, L. D. ; Afzal, F. O. ; Bian, Y. ; Aboketaf, A. ; Dezfulian, K. ; Rakowski, M. ; Augur, R. ; Hirokawa, T. ; Nummy, K. ; Weiss, Sharon M.

IEEE photonics technology letters, 2023-05, Vol.35 (9), p.461-464

New York: IEEE

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4
Smart Cutting Tools and Smart Machining： Development Approaches, and Their Implementation and Application Perspectives
Smart Cutting Tools and Smart Machining： Development Approaches, and Their Implementation and Application Perspectives
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Artigo 		Adicionar ao Meu Espaço

Smart Cutting Tools and Smart Machining： Development Approaches, and Their Implementation and Application Perspectives

Cheng, Kai ; Niu, Zhi-Chao ; Wang, Robin C. ; Rakowski, Richard ; Bateman, Richard

Chinese journal of mechanical engineering, 2017-09, Vol.30 (5), p.1162-1176 [Periódico revisado por pares]

Beijing: Chinese Mechanical Engineering Society

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5
3D Integrated Laser Attach Technology on a 300-mm Monolithic CMOS Silicon Photonics Platform
3D Integrated Laser Attach Technology on a 300-mm Monolithic CMOS Silicon Photonics Platform
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Artigo 		Adicionar ao Meu Espaço

3D Integrated Laser Attach Technology on a 300-mm Monolithic CMOS Silicon Photonics Platform

Bian, Yusheng ; Ramachandran, Koushik ; Wu, Zhuo-Jie ; Hedrick, Brittany ; Dezfulian, Kevin K. ; Houghton, Thomas ; Nummy, Karen ; Fisher, Daniel ; Hirokawa, Takako ; Donegan, Keith ; Afzal, Francis O ; Esopi, Monica ; Karra, Vaishnavi ; Lee, Won Suk ; Sorbara, Massimo ; Lubguban, Jorge ; Cho, Jae Kyu ; Cao, Rongtao ; Ding, Hanyi ; Chandran, Sujith ; Rakowski, Michal ; Aboketaf, Abdelsalam ; Krishnamurthy, Subramanian ; Mills, Scott ; Peng, Bo ; Pepper, Jeff ; Deka, Suruj ; Feng, Wen ; Rishton, Steven ; Boudreau, Marcel ; Logan, Dylan ; Hickey, Ryan ; Gomes, Prova Christina ; Murray, Kyle ; Dewanjee, Arnab ; Riggs, Dave ; Robson, Norman ; Melville, Ian ; Augur, Rod ; Fox, Robert ; Gupta, Vikas ; Yu, Anthony ; Giewont, Ken ; Pellerin, John ; Letavic, Ted

IEEE journal of selected topics in quantum electronics, 2023-05, Vol.29 (3: Photon. Elec. Co-Inte. and Adv. Trans. Print.), p.1-19 [Periódico revisado por pares]

New York: IEEE

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6
CMOS-Integrated Poly-SiGe Piezoresistive Pressure Sensor
CMOS-Integrated Poly-SiGe Piezoresistive Pressure Sensor
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Artigo 		Adicionar ao Meu Espaço

CMOS-Integrated Poly-SiGe Piezoresistive Pressure Sensor

Gonzalez, P. ; Rakowski, M. ; San Segundo, D. ; Severi, S. ; de Meyer, K. ; Witvrouw, A.

IEEE electron device letters, 2012-08, Vol.33 (8), p.1204-1206 [Periódico revisado por pares]

New York, NY: IEEE

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7
O-Band Subwavelength Grating Filters in a Monolithic Photonics Technology
O-Band Subwavelength Grating Filters in a Monolithic Photonics Technology
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Artigo 		Adicionar ao Meu Espaço

O-Band Subwavelength Grating Filters in a Monolithic Photonics Technology

Afzal, Francis O. ; Bian, Yusheng ; Peng, Bo ; Hu, Shuren ; Aboketaf, Abdelsalam ; Dezfulian, Kevin ; Nummy, Karen ; Stricker, Andy ; Hedges, Crystal ; Sowinski, Zoey ; Rakowski, Michal ; Lee, Won Suk ; Augur, Rod ; Riggs, Dave ; Giewont, Ken ; Weiss, Sharon M.

IEEE photonics technology letters, 2020-09, Vol.32 (18), p.1-1

New York: IEEE

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8
Comparative studies on the effect of pilot drillings with application to high-speed drilling of carbon fibre reinforced plastic (CFRP) composites
Comparative studies on the effect of pilot drillings with application to high-speed drilling of carbon fibre reinforced plastic (CFRP) composites
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Comparative studies on the effect of pilot drillings with application to high-speed drilling of carbon fibre reinforced plastic (CFRP) composites

Wang, Chao ; Cheng, Kai ; Rakowski, Richard ; Greenwood, David ; Wale, John

International journal of advanced manufacturing technology, 2017-04, Vol.89 (9-12), p.3243-3255 [Periódico revisado por pares]

London: Springer London

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9
Benchmarking SOI and bulk FinFET alternatives for PLANAR CMOS scaling succession
Benchmarking SOI and bulk FinFET alternatives for PLANAR CMOS scaling succession
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Artigo 		Adicionar ao Meu Espaço

Benchmarking SOI and bulk FinFET alternatives for PLANAR CMOS scaling succession

Chiarella, T. ; Witters, L. ; Mercha, A. ; Kerner, C. ; Rakowski, M. ; Ortolland, C. ; Ragnarsson, L.-Å. ; Parvais, B. ; De Keersgieter, A. ; Kubicek, S. ; Redolfi, A. ; Vrancken, C. ; Brus, S. ; Lauwers, A. ; Absil, P. ; Biesemans, S. ; Hoffmann, T.

Solid-state electronics, 2010-09, Vol.54 (9), p.855-860 [Periódico revisado por pares]

Kidlington: Elsevier Ltd

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10
Modelling and testing the measurement repeatability of linear and angular positions of a measuring arm (miniature NaviFAST 6D DEVICE)
Modelling and testing the measurement repeatability of linear and angular positions of a measuring arm (miniature NaviFAST 6D DEVICE)
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Modelling and testing the measurement repeatability of linear and angular positions of a measuring arm (miniature NaviFAST 6D DEVICE)

Kobierska, Agnieszka ; Rakowski, Piotr ; Podsędkowski, Leszek

Measurement : journal of the International Measurement Confederation, 2022-11, Vol.203, p.111960, Article 111960 [Periódico revisado por pares]

Elsevier Ltd

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