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Nonpolar and Semipolar III-Nitride Light-Emitting Diodes: Achievements and Challenges
Nonpolar and Semipolar III-Nitride Light-Emitting Diodes: Achievements and Challenges
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Nonpolar and Semipolar III-Nitride Light-Emitting Diodes: Achievements and Challenges

Masui, H. ; Nakamura, S. ; DenBaars, S.P. ; Mishra, U.K.

IEEE transactions on electron devices, 2010-01, Vol.57 (1), p.88-100 [Periódico revisado por pares]

IEEE

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Microwave path-loss modeling in urban line-of-sight environments
Microwave path-loss modeling in urban line-of-sight environments
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Microwave path-loss modeling in urban line-of-sight environments

Masui, H. ; Kobayashi, T. ; Akaike, M.

IEEE journal on selected areas in communications, 2002-08, Vol.20 (6), p.1151-1155 [Periódico revisado por pares]

New York: IEEE

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3
Website Publication of Calculation Computer Program and Visualized Pieces both of Bcc and Fcc Pencil Glide Theory for Deformation Texture
Website Publication of Calculation Computer Program and Visualized Pieces both of Bcc and Fcc Pencil Glide Theory for Deformation Texture
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Website Publication of Calculation Computer Program and Visualized Pieces both of Bcc and Fcc Pencil Glide Theory for Deformation Texture

Masui, H. ; Katoh, H.

Materials science forum, 2007-03, Vol.539-543, p.3414-3419 [Periódico revisado por pares]

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4
Influence of stress condition on initiation of magnetostriction in grain oriented silicon steel
Influence of stress condition on initiation of magnetostriction in grain oriented silicon steel
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Influence of stress condition on initiation of magnetostriction in grain oriented silicon steel

Masui, H.

IEEE Transactions on Magnetics, 1995-03, Vol.31 (2), p.930-937

New York, NY: IEEE

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5
Metalorganic chemical vapor deposition growth of high optical quality and high mobility GaN
Metalorganic chemical vapor deposition growth of high optical quality and high mobility GaN
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Metalorganic chemical vapor deposition growth of high optical quality and high mobility GaN

KELLER, B. P ; KELLER, S ; DENBAARS, S. P ; KAPOLNEK, D ; JIANG, W.-N ; WU, Y.-F ; MASUI, H ; WU, X ; HEYING, B ; SPECK, J. S ; MISHRA, U. K

Journal of electronic materials, 1995-11, Vol.24 (11), p.1707-1709 [Periódico revisado por pares]

New York, NY: Institute of Electrical and Electronics Engineers

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6
Pressure dependence of interfacial breakdown between two solid dielectrics: Effects of environmental humidity while assembling and interfacial angle
Pressure dependence of interfacial breakdown between two solid dielectrics: Effects of environmental humidity while assembling and interfacial angle
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Pressure dependence of interfacial breakdown between two solid dielectrics: Effects of environmental humidity while assembling and interfacial angle

Masui, H. ; Osawa, N. ; Yoshioka, Y. ; Yanase, H. ; Okamoto, K.

2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP), 2017, p.543-547

IEEE

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7
SCS-MC-CDMA system with best effort cell structure
SCS-MC-CDMA system with best effort cell structure
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SCS-MC-CDMA system with best effort cell structure

Fujii, T. ; Izuka, N. ; Masui, H. ; Nagate, A.

IEEE International Conference on Communications, 2005. ICC 2005. 2005, 2005, Vol.4, p.2213-2217 Vol. 4

IEEE

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8
Effect of atmospheric pressure MOCVD growth conditions on UV band-edge photoluminescence in GaN thin films
Effect of atmospheric pressure MOCVD growth conditions on UV band-edge photoluminescence in GaN thin films
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Effect of atmospheric pressure MOCVD growth conditions on UV band-edge photoluminescence in GaN thin films

KELLER, B. P ; KELLER, S ; KAPOLNEK, D ; KATO, M ; MASUI, H ; IMAGI, S ; MISHRA, U. K ; DENBAARS, S. P

Electronics letters, 1995-06, Vol.31 (13), p.1102-1103 [Periódico revisado por pares]

London: Institution of Electrical Engineers

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9
A study on channel estimation methods for MC-CDMA systems
A study on channel estimation methods for MC-CDMA systems
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A study on channel estimation methods for MC-CDMA systems

Nagate, A. ; Masui, H. ; Fujii, T.

The 57th IEEE Semiannual Vehicular Technology Conference, 2003. VTC 2003-Spring, 2003, Vol.3, p.2101-2105 vol.3

IEEE

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10
Electrostatic discharge test with simulated coverglass flashover for multi-junction GaAs/Ge solar array design
Electrostatic discharge test with simulated coverglass flashover for multi-junction GaAs/Ge solar array design
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Electrostatic discharge test with simulated coverglass flashover for multi-junction GaAs/Ge solar array design

Bao Hoang ; Wong, F ; Funderburk, V V ; Mengu Cho ; Toyoda, K ; Masui, H

2010 35th IEEE Photovoltaic Specialists Conference, 2010, p.001118-001123

IEEE

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