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Performance of CID camera x-ray imagers at NIF in a harsh neutron environment
Performance of CID camera x-ray imagers at NIF in a harsh neutron environment
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Ata de Congresso 		Adicionar ao Meu Espaço

Performance of CID camera x-ray imagers at NIF in a harsh neutron environment

Palmer, Nathan E ; Schneider, Marilyn B ; Bell, Perry M ; Piston, Ken W ; Moody, James D ; James, D. L ; Ness, Ron A ; Haugh, Michael J ; Lee, Joshua J ; Romano, Edward D Bell, Perry M ; Grim, Gary P

Proceedings of SPIE, the international society for optical engineering, 2013, Vol.8850, p.885009-885009-13

United States: SPIE

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2
Testing of CMOS devices in NIF's harsh neutron environment
Testing of CMOS devices in NIF's harsh neutron environment
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Testing of CMOS devices in NIF's harsh neutron environment

Teruya, Alan T ; Bell, Perry M ; Burns, Scott ; Hagmann, Chris ; Moody, James D ; Richardson, Mike Bell, Perry ; Grim, Gary P

United States: SPIE 2012

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3
Performance of a 512 x 512 gated CMOS imager with a 250 ps exposure time
Performance of a 512 x 512 gated CMOS imager with a 250 ps exposure time
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Performance of a 512 x 512 gated CMOS imager with a 250 ps exposure time

Teruya, Alan T ; Vernon, Stephen P ; Moody, James D ; Hsing, Warren W ; Brown, Christopher G ; Griffin, Matthew ; Mead, Andrew S ; Tran, Vu Bell, Perry ; Grim, Gary P

United States: SPIE 2012

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4
Virtual Access to STEM Careers: Two Preliminary Investigations
Virtual Access to STEM Careers: Two Preliminary Investigations
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Virtual Access to STEM Careers: Two Preliminary Investigations

Ebrahimi, Elham ; Morago, Brittany ; Stocker, James ; Moody, Amelia ; Taylor, Amy ; Pence, Toni ; Jarrett, Matthew ; Blackport, Blake

Virtual, Augmented and Mixed Reality: Applications in Education, Aviation and Industry, p.45-58 [Periódico revisado por pares]

Cham: Springer International Publishing

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5
The discovery of elements 113 to 118
The discovery of elements 113 to 118
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

The discovery of elements 113 to 118

Utyonkov, Vladimir ; Oganessian, Yuri ; Dmitriev, Sergey ; Itkis, Mikhail ; Moody, Kenton ; Stoyer, Mark ; Shaughnessy, Dawn ; Roberto, James ; Rykaczewski, Krzysztof ; Hamilton, Joseph Rudolph, D.

EPJ Web of Conferences, 2016, Vol.131, p.6003 [Periódico revisado por pares]

Les Ulis: EDP Sciences

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6
Atom probe Tomography of fast-diffusing impurities and the effect of gettering in multicrystalline silicon
Atom probe Tomography of fast-diffusing impurities and the effect of gettering in multicrystalline silicon
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Atom probe Tomography of fast-diffusing impurities and the effect of gettering in multicrystalline silicon

Tweddle, David ; Shaw, Eleanor C. ; Douglas, James O. ; Bonilla, Ruy S. ; Moody, Michael P. ; Hamer, Phillip ; Wilshaw, Peter R. Ribeyron, Pierre-Jean ; Hahn, Giso ; Glunz, Stefan ; Brendel, Rolf ; Poortmans, Jef ; Weeber, Arthur ; Ballif, Christophe

AIP conference proceedings, 2018, Vol.1999 (1) [Periódico revisado por pares]

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7
Complete time-resolved polarimetry of scattered light at the National Ignition Facility
Complete time-resolved polarimetry of scattered light at the National Ignition Facility
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Complete time-resolved polarimetry of scattered light at the National Ignition Facility

Turnbull, David ; Ayers, Shannon ; Bell, Perry ; Chow, Robert ; Frieders, Gene ; Hibbard, Robin L ; Michel, Pierre ; Ralph, Joseph E ; Ross, James S ; Stanley, Joel R ; Vickers, James L ; Zeid, Ziad M ; Moody, John D Grim, Gary P ; Koch, Jeffrey A

SPIE 2015

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8
Efficiency and decay time measurement of phosphors for x-ray framing cameras usable in harsh radiation background
Efficiency and decay time measurement of phosphors for x-ray framing cameras usable in harsh radiation background
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Ata de Congresso 		Adicionar ao Meu Espaço

Efficiency and decay time measurement of phosphors for x-ray framing cameras usable in harsh radiation background

IZUMI, N ; EMIG, J ; CERJAN, C ; FELKER, B ; SORCE, C ; KRAUTER, K ; GLENN, S ; BOURGADE, J.-L ; KILKENNY, J. D ; BRADLEY, D. K ; BELL, P. M ; MOODY, J ; MIDDLETON, C ; HOLDER, J ; PISTON, K ; SMALYUK, V ; HAGMANN, C ; AYERS, J ; CELESTE, J

Proceedings of SPIE, the International Society for Optical Engineering, 2011, Vol.8142

Bellingham Wash: SPIE

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9
Growth and Characterization of AlN and AlGaN Epitaxial Films on AlN Single Crystal Substrates
Growth and Characterization of AlN and AlGaN Epitaxial Films on AlN Single Crystal Substrates
Material Type:
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Growth and Characterization of AlN and AlGaN Epitaxial Films on AlN Single Crystal Substrates

Dalmau, Rafael ; Moody, Baxter ; Schlesser, Raoul ; Mita, Seiji ; Xie, Jinqiao ; Feneberg, Martin ; Neuschl, Benjamin ; Thonke, Klaus ; Collazo, Ramón ; Rice, Anthony ; Tweedie, James ; Sitar, Zlatko

ECS transactions, , Vol.33 (13), p.43-54

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10
ACCESS Pointing Control System
ACCESS Pointing Control System
Material Type:
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ACCESS Pointing Control System

BRUGAROLAS, Paul ; ALEXANDER, James ; O'CONNOR, David ; PATRICK, Richard ; ORZECHOWSKI, Pawel ; SPITTLER, Connie ; LILLIE, Chuck ; TRAUGER, John ; MOODY, Dwight ; EGERMAN, Robert ; VALLONE, Phillip ; ELIAS, Jason ; HEJAL, Reem ; CAMELO, Vanessa ; BRONOWICKI, Allen

Proceedings of SPIE, the International Society for Optical Engineering, 2010, Vol.7731

Bellingham, Wash: SPIE

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