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Raadsma, H W ; Moser, G ; Crump, R E ; Khatkar, M S ; Zenger, K R ; Cavanagh, J A L ; Hawken, R J ; Hobbs, M ; Barris, W ; Solkner, J ; Nicholas, F W ; Tier, B
Developments in biologicals, 2008, Vol.132, p.219
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Scanning electron microscopy/energy dispersive spectrometry fixedbeam or overscan x-ray microanalysis of particles can miss the real structure: x-ray spectrum image mapping reveals the true nature
Newbury, Dale E ; Ritchie, NicholasW. M Platek, S. Frank ; Maugel, Tim K ; Postek, Michael T ; Newbury, Dale E
Proceedings of SPIE, the international society for optical engineering, 2013, Vol.8729, p.872902-872902-9
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Davis, Jack V. ; Marrs, FrankW. ; Burch, Alexandra C. ; Lease, Nicholas ; Cawkwell, Marc ; Manner, Virginia W. Germann, Timothy C. ; Gleason, Arianna E. ; Armstrong, Michael R. ; Lane, J. Matthew D. ; Jordan, Jennifer L.
AIP Conference Proceedings, 2023, Vol.2844 (1)
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Lopez, Frank E ; Herrmann, Hans W ; Leeper, Ramon J ; Batha, Steve H ; Oertel, John A ; Griego, Jeffrey R ; Steinfeld, Brian C ; Polk, Paul J ; Goodwin, Lynne A ; Fatherley, Valerie E ; Archuleta, Thomas N ; Aragonez, Robert J ; Pederson, Benjamin J ; Celeste, John R ; Hibbard, Robin L ; Carpenter, Arthur C ; Hernandez, Jose E ; Carrera, Jorge A ; Khater, Hesham Y ; Downing, Eric L ; St. Hilaire, Nicholas L ; Sitaraman, Shiva Grim, Gary P ; Koch, Jeffrey A
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