Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Measurement of specimen thickness by phase change determination in TEMCroitoru, M.D. ; Van Dyck, D. ; Liu, Y.Z. ; Zhang, Z.Ultramicroscopy, 2008-11, Vol.108 (12), p.1616-1622 [Periódico revisado por pares]Netherlands: Elsevier B.VTexto completo disponível |
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2 |
Material Type: Artigo
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An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic imagesCroitoru, M.D. ; Van Dyck, D. ; Van Aert, S. ; Bals, S. ; Verbeeck, J.Ultramicroscopy, 2006-08, Vol.106 (10), p.933-940 [Periódico revisado por pares]Netherlands: Elsevier B.VTexto completo disponível |