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Refinado por: Nome da Publicação: Ultramicroscopy remover
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1
On the detection of multiple events in atom probe tomography
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On the detection of multiple events in atom probe tomography

Peng, Zirong ; Vurpillot, Francois ; Choi, Pyuck-Pa ; Li, Yujiao ; Raabe, Dierk ; Gault, Baptiste

Ultramicroscopy, 2018-06, Vol.189, p.54-60 [Periódico revisado por pares]

Netherlands: Elsevier B.V

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2
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection
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Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection

Bitrus, Samuel ; Fitzek, Harald ; Rigger, Eugen ; Rattenberger, Johannes ; Entner, Doris

Ultramicroscopy, 2022-10, Vol.240, p.113567-113567, Article 113567 [Periódico revisado por pares]

Elsevier B.V

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3
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons
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Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons

Gureyev, T.E. ; Quiney, H.M. ; Kozlov, A. ; Allen, L.J.

Ultramicroscopy, 2020-11, Vol.218, p.113094-113094, Article 113094 [Periódico revisado por pares]

Elsevier B.V

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4
A multiple scattering algorithm for three dimensional phase contrast atomic electron tomography
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A multiple scattering algorithm for three dimensional phase contrast atomic electron tomography

Ren, David ; Ophus, Colin ; Chen, Michael ; Waller, Laura

Ultramicroscopy, 2020-01, Vol.208 (C), p.112860-112860, Article 112860 [Periódico revisado por pares]

Netherlands: Elsevier B.V

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5
Nanoimmunosensor based on atomic force spectroscopy to detect anti-myelin basic protein related to early-stage multiple sclerosis
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Artigo
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Nanoimmunosensor based on atomic force spectroscopy to detect anti-myelin basic protein related to early-stage multiple sclerosis

Garcia, Pâmela Soto ; Brum, Doralina Guimarães ; Oliveira, Osvaldo N. ; Higa, Akemi Martins ; Ierich, Jéssica Cristiane Magalhães ; Moraes, Ariana de Souza ; Shimizu, Flávio Makoto ; Okuda-Shinagawa, Nancy M. ; Peroni, Luís Antonio ; da Gama, Paulo Diniz ; Machini, M. Teresa ; Leite, Fabio Lima

Ultramicroscopy, 2020-04, Vol.211, p.112946-112946, Article 112946 [Periódico revisado por pares]

Netherlands: Elsevier B.V

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6
Empirical determination of transmission attenuation curves in mass–thickness contrast TEM imaging
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Empirical determination of transmission attenuation curves in mass–thickness contrast TEM imaging

Yamasaki, Jun ; Ubata, Yuya ; Yasuda, Hidehiro

Ultramicroscopy, 2019-05, Vol.200, p.20-27 [Periódico revisado por pares]

Netherlands: Elsevier B.V

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7
Reduction of multiple hits in atom probe tomography
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Reduction of multiple hits in atom probe tomography

Thuvander, Mattias ; Kvist, Anders ; Johnson, Lars J.S. ; Weidow, Jonathan ; Andrén, Hans-Olof

Ultramicroscopy, 2013-09, Vol.132, p.81-85 [Periódico revisado por pares]

Netherlands: Elsevier B.V

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8
Solving protein nanocrystals by cryo-EM diffraction: Multiple scattering artifacts
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Solving protein nanocrystals by cryo-EM diffraction: Multiple scattering artifacts

Subramanian, Ganesh ; Basu, Shibom ; Liu, Haiguang ; Zuo, Jian-Min ; Spence, John C.H.

Ultramicroscopy, 2015-01, Vol.148, p.87-93 [Periódico revisado por pares]

Netherlands: Elsevier B.V

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9
Numerical modeling of specimen geometry for quantitative energy dispersive X-ray spectroscopy
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Numerical modeling of specimen geometry for quantitative energy dispersive X-ray spectroscopy

Xu, W. ; Dycus, J.H. ; LeBeau, J.M.

Ultramicroscopy, 2018-01, Vol.184 (Pt A), p.100-108 [Periódico revisado por pares]

Netherlands: Elsevier B.V

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10
Multiple strains and polar states in PbZr0.52Ti0.48O3/PbTiO3 superlattices revealed by aberration-corrected HAADF-STEM imaging
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Multiple strains and polar states in PbZr0.52Ti0.48O3/PbTiO3 superlattices revealed by aberration-corrected HAADF-STEM imaging

Tang, Y.L. ; Zhu, Y.L. ; Wang, Y.J. ; Ma, X.L.

Ultramicroscopy, 2018-10, Vol.193, p.84-89 [Periódico revisado por pares]

Elsevier B.V

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