Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Functions to map photoelectron distributions in a variety of setups in angle-resolved photoemission spectroscopyIshida, Y. ; Shin, S.Review of scientific instruments, 2018-04, Vol.89 (4), p.043903-043903 [Periódico revisado por pares]United StatesTexto completo disponível |
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2 |
Material Type: Artigo
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Time-resolved photoemission apparatus achieving sub-20-meV energy resolution and high stabilityIshida, Y ; Togashi, T ; Yamamoto, K ; Tanaka, M ; Kiss, T ; Otsu, T ; Kobayashi, Y ; Shin, SReview of scientific instruments, 2014-12, Vol.85 (12), p.123904-123904 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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3 |
Material Type: Artigo
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Publisher’s Note: “Functions to map photoelectron distributions in a variety of setups in angle-resolved photoemission spectroscopy” [Rev. Sci. Instrum. 89, 043903 (2018)]Ishida, Y. ; Shin, S.Review of scientific instruments, 2018-05, Vol.89 (5), p.059901-059901 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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4 |
Material Type: Artigo
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High repetition pump-and-probe photoemission spectroscopy based on a compact fiber laser systemIshida, Y. ; Otsu, T. ; Ozawa, A. ; Yaji, K. ; Tani, S. ; Shin, S. ; Kobayashi, Y.Review of scientific instruments, 2016-12, Vol.87 (12), p.123902-123902 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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5 |
Material Type: Artigo
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Time-, spin-, and angle-resolved photoemission spectroscopy with a 1-MHz 10.7-eV pulse laserKawaguchi, Kaishu ; Kuroda, Kenta ; Zhao, Z. ; Tani, S. ; Harasawa, A. ; Fukushima, Y. ; Tanaka, H. ; Noguchi, R. ; Iimori, T. ; Yaji, K. ; Fujisawa, M. ; Shin, S. ; Komori, F. ; Kobayashi, Y. ; Kondo, TakeshiReview of scientific instruments, 2023-08, Vol.94 (8) [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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6 |
Material Type: Artigo
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A versatile system for ultrahigh resolution, low temperature,and polarization dependent Laser-angle-resolved photoemission spectroscopyKiss, T ; Shimojima, T ; Ishizaka, K ; Chainani, A ; Togashi, T ; Kanai, T ; Wang, X.-Y ; Chen, C.-T ; Watanabe, S ; Shin, SReview of scientific instruments, 2008-02, Vol.79 (2), p.023106-023106-7 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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7 |
Material Type: Artigo
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Ultrafast spin-switching of a ferrimagnetic alloy at room temperature traced by resonant magneto-optical Kerr effect using a seeded free electron laserYamamoto, Sh ; Taguchi, M ; Someya, T ; Kubota, Y ; Ito, S ; Wadati, H ; Fujisawa, M ; Capotondi, F ; Pedersoli, E ; Manfredda, M ; Raimondi, L ; Kiskinova, M ; Fujii, J ; Moras, P ; Tsuyama, T ; Nakamura, T ; Kato, T ; Higashide, T ; Iwata, S ; Yamamoto, S ; Shin, S ; Matsuda, IReview of scientific instruments, 2015-08, Vol.86 (8), p.083901-083901 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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8 |
Material Type: Artigo
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Triple-path collector optics for grazing incident x-ray emission spectrometerTokushima, T ; Horikawa, Y ; Shin, SReview of scientific instruments, 2011-07, Vol.82 (7), p.073108-073108-5 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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9 |
Material Type: Artigo
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Top-up operation at Pohang Light Source-IIHwang, I ; Huang, J Y ; Kim, M ; Lee, B-J ; Kim, C ; Choi, J-Y ; Kim, M-H ; Lee, H S ; Moon, D ; Lee, E H ; Kim, D-E ; Nam, S H ; Shin, S ; Cho, MoohyunReview of scientific instruments, 2014-05, Vol.85 (5), p.055113-055113 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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10 |
Material Type: Artigo
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A transverse bunch by bunch feedback system for Pohang Light Source upgradeLee, E-H ; Kim, D-T ; Huang, J-Y ; Shin, S ; Nakamura, T ; Kobayashi, KReview of scientific instruments, 2014-12, Vol.85 (12), p.125102-125102 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |