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Dynamic diamond anvil cell (dDAC): A novel device for studying the dynamic-pressure properties of materials
Dynamic diamond anvil cell (dDAC): A novel device for studying the dynamic-pressure properties of materials
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Dynamic diamond anvil cell (dDAC): A novel device for studying the dynamic-pressure properties of materials

Evans, William J. ; Yoo, Choong-Shik ; Lee, Geun Woo ; Cynn, Hyunchae ; Lipp, Magnus J. ; Visbeck, Ken

Review of scientific instruments, 2007-07, Vol.78 (7), p.073904-073904 [Periódico revisado por pares]

United States

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2
Contributed Review: Culet diameter and the achievable pressure of a diamond anvil cell: Implications for the upper pressure limit of a diamond anvil cell
Contributed Review: Culet diameter and the achievable pressure of a diamond anvil cell: Implications for the upper pressure limit of a diamond anvil cell
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Contributed Review: Culet diameter and the achievable pressure of a diamond anvil cell: Implications for the upper pressure limit of a diamond anvil cell

O’Bannon, Earl F. ; Jenei, Zsolt ; Cynn, Hyunchae ; Lipp, Magnus J. ; Jeffries, Jason R.

Review of Scientific Instruments, 2018-11, Vol.89 (11), p.111501-111501 [Periódico revisado por pares]

United States: American Institute of Physics

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3
Note: Soft X-ray transmission polarizer based on ferromagnetic thin films
Note: Soft X-ray transmission polarizer based on ferromagnetic thin films
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Note: Soft X-ray transmission polarizer based on ferromagnetic thin films

Müller, L. ; Hartmann, G. ; Schleitzer, S. ; Berntsen, M. H. ; Walther, M. ; Rysov, R. ; Roseker, W. ; Scholz, F. ; Seltmann, J. ; Glaser, L. ; Viefhaus, J. ; Mertens, K. ; Bagschik, K. ; Frömter, R. ; De Fanis, A. ; Shevchuk, I. ; Medjanik, K. ; Öhrwall, G. ; Oepen, H. P. ; Martins, M. ; Meyer, M. ; Grübel, G.

Review of scientific instruments, 2018-03, Vol.89 (3), p.036103-036103 [Periódico revisado por pares]

United States

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4
Industry-relevant magnetron sputtering and cathodic arc ultra-high vacuum deposition system for in situ x-ray diffraction studies of thin film growth using high energy synchrotron radiation
Industry-relevant magnetron sputtering and cathodic arc ultra-high vacuum deposition system for in situ x-ray diffraction studies of thin film growth using high energy synchrotron radiation
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Industry-relevant magnetron sputtering and cathodic arc ultra-high vacuum deposition system for in situ x-ray diffraction studies of thin film growth using high energy synchrotron radiation

Schroeder, J L ; Thomson, W ; Howard, B ; Schell, N ; Näslund, L-Å ; Rogström, L ; Johansson-Jõesaar, M P ; Ghafoor, N ; Odén, M ; Nothnagel, E ; Shepard, A ; Greer, J ; Birch, J

Review of scientific instruments, 2015-09, Vol.86 (9), p.095113-095113 [Periódico revisado por pares]

United States

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5
Feedback compensated 10 kW solid-state pulsed power amplifier at 352 MHz for particle accelerators
Feedback compensated 10 kW solid-state pulsed power amplifier at 352 MHz for particle accelerators
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Feedback compensated 10 kW solid-state pulsed power amplifier at 352 MHz for particle accelerators

Duc, L. Hoang ; Jobs, M. ; Lofnes, T. ; Ruber, R. ; Olsson, J. ; Dancila, D.

Review of scientific instruments, 2019-10, Vol.90 (10) [Periódico revisado por pares]

Melville: American Institute of Physics

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6
Digital smoothing of the Langmuir probe I - V characteristic
Digital smoothing of the Langmuir probe I - V characteristic
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Digital smoothing of the Langmuir probe I - V characteristic

Magnus, F. ; Gudmundsson, J. T.

Review of scientific instruments, 2008-07, Vol.79 (7), p.073503-073503-8 [Periódico revisado por pares]

United States: American Institute of Physics

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7
A spin- and angle-resolving photoelectron spectrometer
A spin- and angle-resolving photoelectron spectrometer
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A spin- and angle-resolving photoelectron spectrometer

Berntsen, M. H. ; Palmgren, P. ; Leandersson, M. ; Hahlin, A. ; Åhlund, J. ; Wannberg, B. ; Månsson, M. ; Tjernberg, O.

Review of scientific instruments, 2010-03, Vol.81 (3), p.035104-035104-5 [Periódico revisado por pares]

United States: American Institute of Physics

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8
An experimental setup for high resolution 10.5 eV laser-based angle-resolved photoelectron spectroscopy using a time-of-flight electron analyzer
An experimental setup for high resolution 10.5 eV laser-based angle-resolved photoelectron spectroscopy using a time-of-flight electron analyzer
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An experimental setup for high resolution 10.5 eV laser-based angle-resolved photoelectron spectroscopy using a time-of-flight electron analyzer

Berntsen, M. H. ; Götberg, O. ; Tjernberg, O.

Review of scientific instruments, 2011-09, Vol.82 (9), p.095113-095113-8 [Periódico revisado por pares]

United States: American Institute of Physics

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9
A custom built lathe designed for in operando high-energy x-ray studies at industrially relevant cutting parameters
A custom built lathe designed for in operando high-energy x-ray studies at industrially relevant cutting parameters
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A custom built lathe designed for in operando high-energy x-ray studies at industrially relevant cutting parameters

Rogström, L. ; Chen, Y. H. ; Johansson Jõesaar, M. P. ; Eriksson, J. ; Fallqvist, M. ; Andersson, J. M. ; Schell, N. ; Odén, M. ; Birch, J.

Review of scientific instruments, 2019-10, Vol.90 (10) [Periódico revisado por pares]

Melville: American Institute of Physics

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10
Principle, calibration, and application of the in situ alkali chloride monitor
Principle, calibration, and application of the in situ alkali chloride monitor
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Principle, calibration, and application of the in situ alkali chloride monitor

Forsberg, Christer ; Broström, Markus ; Backman, Rainer ; Edvardsson, Elin ; Badiei, Shahriar ; Berg, Magnus ; Kassman, Håkan

Review of scientific instruments, 2009-02, Vol.80 (2), p.023104-023104-4 [Periódico revisado por pares]

United States: American Institute of Physics

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Deste Autor:

  1. Galvao, R
  2. Elfimov, A
  3. Nascimento, I
  4. Fagundes, A
  5. Silva, R

Neste Assunto:

  1. Physical Sciences
  2. Physics
  3. Physics, Applied
  4. Science & Technology
  5. Technology

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