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Papers from the International Workshop on INSIGHT in Semiconductor Device Fabrication, Metrology and Modeling : 6-9 May 2007, Napa, California
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Papers from the International Workshop on INSIGHT in Semiconductor Device Fabrication, Metrology and Modeling : 6-9 May 2007, Napa, California

International Workshop on INSIGHT in Semiconductor Device Fabrication, Metrology and Modeling (2007 : Napa Valley, Calif.)

Journal of vacuum science & technology. B, Microelectronics and nanometer structures 2nd ser., v. 26, no. 1 (DLC) 94657460 (OCoLC)23276603

New York : Published by AVS through the American Institute of Physics 2008

Localização: IF - Instituto de Física    (J.Vac.Sci.Technol.B v.26(1)200 )(Acessar)

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Deste Autor:

  1. International Workshop on INSIGHT in Semiconductor Device Fabrication, M

Neste Assunto:

  1. Semiconductors
  2. Semicondutores (Congressos)

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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