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Refinado por: Nome da Publicação: Journal Of Applied Physics remover
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Low-temperature electron transport of rutile-type GexSn1−xO2
Low-temperature electron transport of rutile-type GexSn1−xO2
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Low-temperature electron transport of rutile-type GexSn1−xO2

Takane, Hitoshi ; Kakeya, Itsuhiro ; Izumi, Hirokazu ; Wakamatsu, Takeru ; Isobe, Yuki ; Kaneko, Kentaro ; Tanaka, Katsuhisa

Journal of applied physics, 2023-10, Vol.134 (16) [Periódico revisado por pares]

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2
Room temperature two-dimensional electron gas scattering time, effective mass, and mobility parameters in AlxGa1−xN/GaN heterostructures (0.07 ≤ x ≤ 0.42)
Room temperature two-dimensional electron gas scattering time, effective mass, and mobility parameters in AlxGa1−xN/GaN heterostructures (0.07 ≤ x ≤ 0.42)
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Room temperature two-dimensional electron gas scattering time, effective mass, and mobility parameters in AlxGa1−xN/GaN heterostructures (0.07 ≤ x ≤ 0.42)

Knight, Sean ; Richter, Steffen ; Papamichail, Alexis ; Kühne, Philipp ; Armakavicius, Nerijus ; Guo, Shiqi ; Persson, Axel R. ; Stanishev, Vallery ; Rindert, Viktor ; Persson, Per O. Å. ; Paskov, Plamen P. ; Schubert, Mathias ; Darakchieva, Vanya

Journal of applied physics, 2023-11, Vol.134 (18) [Periódico revisado por pares]

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3
Temperature dependent electron–phonon coupling of Au resolved via lattice dynamics measured with sub-picosecond infrared pulses
Temperature dependent electron–phonon coupling of Au resolved via lattice dynamics measured with sub-picosecond infrared pulses
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Temperature dependent electron–phonon coupling of Au resolved via lattice dynamics measured with sub-picosecond infrared pulses

Tomko, John A. ; Kumar, Sushant ; Sundararaman, Ravishankar ; Hopkins, Patrick E.

Journal of applied physics, 2021-05, Vol.129 (19) [Periódico revisado por pares]

Melville: American Institute of Physics

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4
Fast electron temperature measurements using a "multicolor" optical soft x-ray array
Fast electron temperature measurements using a "multicolor" optical soft x-ray array
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Fast electron temperature measurements using a "multicolor" optical soft x-ray array

Delgado-Aparicio, L F ; Stutman, D ; Tritz, K ; Finkenthal, M ; Bell, R ; Hosea, J ; Kaita, R ; LeBlanc, B ; Roquemore, L ; Wilson, J R

Journal of applied physics, 2007-10, Vol.102 (7), p.073304-073304-7 [Periódico revisado por pares]

United States: American Institute of Physics

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5
Gas temperature and electron temperature measurements by emission spectroscopy for an atmospheric microplasma
Gas temperature and electron temperature measurements by emission spectroscopy for an atmospheric microplasma
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Gas temperature and electron temperature measurements by emission spectroscopy for an atmospheric microplasma

Mariotti, Davide ; Shimizu, Yoshiki ; Sasaki, Takeshi ; Koshizaki, Naoto

Journal of applied physics, 2007-01, Vol.101 (1) [Periódico revisado por pares]

United States

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6
Impact of metal gates on remote phonon scattering in titanium nitride/hafnium dioxide n -channel metal-oxide-semiconductor field effect transistors-low temperature electron mobility study
Impact of metal gates on remote phonon scattering in titanium nitride/hafnium dioxide n -channel metal-oxide-semiconductor field effect transistors-low temperature electron mobility study
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Impact of metal gates on remote phonon scattering in titanium nitride/hafnium dioxide n -channel metal-oxide-semiconductor field effect transistors-low temperature electron mobility study

Maitra, Kingsuk ; Frank, Martin M ; Narayanan, Vijay ; Misra, Veena ; Cartier, Eduard A

Journal of applied physics, 2007-12, Vol.102 (11), p.114507-114507-5 [Periódico revisado por pares]

American Institute of Physics

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7
Effect of fast drifting electrons on electron temperature measurement with a triple Langmuir probe
Effect of fast drifting electrons on electron temperature measurement with a triple Langmuir probe
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Effect of fast drifting electrons on electron temperature measurement with a triple Langmuir probe

Biswas, Subir ; Chowdhury, Satyajit ; Palivela, Yaswanth ; Pal, Rabindranath

Journal of applied physics, 2015-08, Vol.118 (6) [Periódico revisado por pares]

Melville: American Institute of Physics

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8
Low-temperature electron transport of rutile-type Ge x Sn1− x O2
Low-temperature electron transport of rutile-type Ge x Sn1− x O2
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Low-temperature electron transport of rutile-type Ge x Sn1− x O2

Takane, Hitoshi ; Kakeya, Itsuhiro ; Izumi, Hirokazu ; Wakamatsu, Takeru ; Isobe, Yuki ; Kaneko, Kentaro ; Tanaka, Katsuhisa

Journal of applied physics, 2023-10, Vol.134 (16) [Periódico revisado por pares]

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9
Temperature dependence of secondary electron emission: A new route to nanoscale temperature measurement using scanning electron microscopy
Temperature dependence of secondary electron emission: A new route to nanoscale temperature measurement using scanning electron microscopy
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Temperature dependence of secondary electron emission: A new route to nanoscale temperature measurement using scanning electron microscopy

Khan, M. I. ; Lubner, S. D. ; Ogletree, D. F. ; Dames, C.

Journal of applied physics, 2018-11, Vol.124 (19) [Periódico revisado por pares]

Melville: American Institute of Physics

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10
Publisher's Note: "Stability of very-high pressure arc discharges against perturbations of the electron temperature" [ J. Appl. Phys. 111 , 073305 ( 2012 ) ]
Publisher's Note: "Stability of very-high pressure arc discharges against perturbations of the electron temperature" [ J. Appl. Phys. 111 , 073305 ( 2012 ) ]
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Publisher's Note: "Stability of very-high pressure arc discharges against perturbations of the electron temperature" [ J. Appl. Phys. 111 , 073305 ( 2012 ) ]

Benilov, M S ; Hechtfischer, U

Journal of applied physics, 2012-05, Vol.111 (9), p.099907-099907-1 [Periódico revisado por pares]

American Institute of Physics

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