Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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A Survey on Software Fault LocalizationWong, W. Eric ; Ruizhi Gao ; Yihao Li ; Abreu, Rui ; Wotawa, FranzIEEE transactions on software engineering, 2016-08, Vol.42 (8), p.707-740 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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2 |
Material Type: Artigo
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An Empirical Study of Fault Localization Families and Their CombinationsZou, Daming ; Liang, Jingjing ; Xiong, Yingfei ; Ernst, Michael D. ; Zhang, LuIEEE transactions on software engineering, 2021-02, Vol.47 (2), p.332-347 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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GenProg: A Generic Method for Automatic Software RepairLe Goues, C. ; ThanhVu Nguyen ; Forrest, S. ; Weimer, W.IEEE transactions on software engineering, 2012-01, Vol.38 (1), p.54-72 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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4 |
Material Type: Artigo
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Fault Analysis and Debugging of Microservice Systems: Industrial Survey, Benchmark System, and Empirical StudyZhou, Xiang ; Peng, Xin ; Xie, Tao ; Sun, Jun ; Ji, Chao ; Li, Wenhai ; Ding, DanIEEE transactions on software engineering, 2021-02, Vol.47 (2), p.243-260 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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5 |
Material Type: Artigo
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MSeer-An Advanced Technique for Locating Multiple Bugs in ParallelGao, Ruizhi ; Wong, W. EricIEEE transactions on software engineering, 2019-03, Vol.45 (3), p.301-318 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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6 |
Material Type: Artigo
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Automatic Software Repair: A SurveyGazzola, Luca ; Micucci, Daniela ; Mariani, LeonardoIEEE transactions on software engineering, 2019-01, Vol.45 (1), p.34-67 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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7 |
Material Type: Artigo
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An Empirical Study of Boosting Spectrum-Based Fault Localization via PageRankZhang, Mengshi ; Li, Yaoxian ; Li, Xia ; Chen, Lingchao ; Zhang, Yuqun ; Zhang, Lingming ; Khurshid, SarfrazIEEE transactions on software engineering, 2021-06, Vol.47 (6), p.1089-1113 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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8 |
Material Type: Artigo
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Statistical Debugging: A Hypothesis Testing-Based ApproachChao Liu ; Long Fei ; Xifeng Yan ; Jiawei Han ; Midkiff, S.P.IEEE transactions on software engineering, 2006-10, Vol.32 (10), p.831-848 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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9 |
Material Type: Artigo
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Nopol: Automatic Repair of Conditional Statement Bugs in Java ProgramsJifeng Xuan ; Martinez, Matias ; DeMarco, Favio ; Clement, Maxime ; Lamelas Marcote, Sebastian ; Durieux, Thomas ; Le Berre, Daniel ; Monperrus, MartinIEEE transactions on software engineering, 2017-01, Vol.43 (1), p.34-55 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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10 |
Material Type: Artigo
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Data Quality Matters: A Case Study on Data Label Correctness for Security Bug Report PredictionWu, Xiaoxue ; Zheng, Wei ; Xia, Xin ; Lo, DavidIEEE transactions on software engineering, 2022-07, Vol.48 (7), p.2541-2556 [Periódico revisado por pares]New York: IEEETexto completo disponível |