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Material Type: Artigo
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EMC Testing of Electricity Meters Using Real-World and Artificial Current Waveformsvan den Brom, Helko E. ; van Leeuwen, Ronald ; Marais, Zander ; ten Have, Bas ; Hartman, Tom ; Azpurua, Marco ; Pous, Marc ; Kok, Gertjan ; van Veghel, Marijn ; Kolevatov, Ilia ; Malmbekk, Helge ; Silva, Ferran ; Leferink, FrankIEEE transactions on electromagnetic compatibility, 2021-12, Vol.63 (6), p.1865-1874 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Analyzing Transient Phenomena in the Time Domain Using the Feature Selective Validation (FSV) MethodJauregui, Ricardo ; Gang Zhang ; Rojas-Mora, Julio ; Ventosa, Oriol ; Silva, Ferran ; Duffy, Alistair P. ; Sasse, HughIEEE transactions on electromagnetic compatibility, 2014-08, Vol.56 (4), p.825-834 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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A Review on the Drawbacks and Enhancement Opportunities of the Feature Selective ValidationAzpurua, Marco A. ; Paez, Eduardo ; Rojas-Mora, Julio ; Ventosa, Oriol ; Silva, Ferran ; Gang Zhang ; Duffy, Alistair P. ; Jauregui, RicardoIEEE transactions on electromagnetic compatibility, 2014-08, Vol.56 (4), p.800-807 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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A Near-Field Probe for In Situ EMI Measurements of Industrial InstallationsQuilez, M. ; Aragon, M. ; Atienza, A. ; Fernandez-Chimeno, M. ; Riu, P.J. ; Silva, F.IEEE transactions on electromagnetic compatibility, 2008-11, Vol.50 (4), p.1007-1010 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |