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Refinado por: Nome da Publicação: IEEE Transactions on Applied Superconductivity remover
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1
Electromagnetic and Thermal Properties of HTS Bulk Combined with Different Ferromagnetic Structures under Pulsed Field Magnetization
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Electromagnetic and Thermal Properties of HTS Bulk Combined with Different Ferromagnetic Structures under Pulsed Field Magnetization

Li, Rui ; Fang, Jin ; Liao, Xu ; Wang, Yuan ; Wu, Yue ; Wang, Zhe ; Zan, Yuanting ; Wang, Xiu

IEEE transactions on applied superconductivity, 2023-09, Vol.33 (6), p.1-10 [Periódico revisado por pares]

New York: IEEE

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2
Demagnetizing the Superconducting Part of the Magnetic Cloak
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Demagnetizing the Superconducting Part of the Magnetic Cloak

Kucharovic, M ; Gomory, F ; Solovyov, M

IEEE transactions on applied superconductivity, 2024-05, Vol.34 (3), p.1 [Periódico revisado por pares]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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3
Test Results of the First Series Magnet of Beam Separation Dipole for the HL-LHC Upgrade
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Test Results of the First Series Magnet of Beam Separation Dipole for the HL-LHC Upgrade

Suzuki, K. ; Ikemoto, Y. ; Kawamata, H. ; Kimura, N. ; Nakamoto, T. ; Ogitsu, T. ; Okada, N. ; Okada, R. ; Sugano, M. ; Tanaka, K. ; Takahashi, N. ; Perez, J. C. ; Todesco, E.

IEEE transactions on applied superconductivity, 2024-01, Vol.34 (5), p.1-6 [Periódico revisado por pares]

New York: IEEE

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4
Properties of Ferromagnetic Josephson Junctions for Memory Applications
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Properties of Ferromagnetic Josephson Junctions for Memory Applications

Caruso, Roberta ; Massarotti, Davide ; Miano, Alessandro ; Bolginov, Vitaliy V. ; Ben Hamida, Aymen ; Karelina, Liubov N. ; Campagnano, Gabriele ; Vernik, Igor V. ; Tafuri, Francesco ; Ryazanov, Valery V. ; Mukhanov, Oleg A. ; Pepe, Giovanni P.

IEEE transactions on applied superconductivity, 2018-10, Vol.28 (7), p.1-6 [Periódico revisado por pares]

IEEE

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5
Finite-Element Formulations for Systems With High-Temperature Superconductors
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Finite-Element Formulations for Systems With High-Temperature Superconductors

Dular, Julien ; Geuzaine, Christophe ; Vanderheyden, Benoit

IEEE transactions on applied superconductivity, 2020-04, Vol.30 (3), p.1-13 [Periódico revisado por pares]

New York: IEEE

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6
Superconducting Synchronous Motor Development for Airplane Applications - Mechanical and Electrical Design of a Prototype 100 kW Motor
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Superconducting Synchronous Motor Development for Airplane Applications - Mechanical and Electrical Design of a Prototype 100 kW Motor

Kalsi, Swarn S. ; Storey, James G. ; Brooks, Justin M. ; Lumsden, Grant ; BadcockSenior, Rodney A.

IEEE transactions on applied superconductivity, 2023-08, Vol.33 (5), p.1-6 [Periódico revisado por pares]

New York: IEEE

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7
Effect of interfaces on supercurrent through ferromagnetic materials
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Effect of interfaces on supercurrent through ferromagnetic materials

Mishra, Swapna Sindhu ; Loloee, Reza ; Birge, Norman O.

IEEE transactions on applied superconductivity, 2023-10, Vol.33 (7), p.1-7 [Periódico revisado por pares]

New York: IEEE

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8
Semianalytical Modeling of AC Losses in HTS Stacks Near Ferromagnetic Parts
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Semianalytical Modeling of AC Losses in HTS Stacks Near Ferromagnetic Parts

Statra, Yazid ; Menana, Hocine ; Douine, Bruno

IEEE transactions on applied superconductivity, 2021-01, Vol.31 (1), p.1-6 [Periódico revisado por pares]

New York: IEEE

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9
An Experimental Study on the Passive Shimming in the 0.5 T Superconducting MRI Magnet
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An Experimental Study on the Passive Shimming in the 0.5 T Superconducting MRI Magnet

Qu, Hongyi ; Wang, Hui ; Chen, Qi ; Wang, Cong ; Liu, Xin ; Wang, Qiuliang

IEEE transactions on applied superconductivity, 2022-10, Vol.32 (7), p.1-7 [Periódico revisado por pares]

New York: IEEE

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10
HTS Cable International Round Robin: 4.4 kA Critical Current Measurements
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HTS Cable International Round Robin: 4.4 kA Critical Current Measurements

Hutson, R. G. ; Raine, M. J. ; Kiuchi, M. ; Matsushita, T. ; Hampshire, D. P.

IEEE transactions on applied superconductivity, 2023-08, Vol.33 (5), p.1-5 [Periódico revisado por pares]

New York: IEEE

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