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SPAD Figures of Merit for Photon-Counting, Photon-Timing, and Imaging Applications: A Review
SPAD Figures of Merit for Photon-Counting, Photon-Timing, and Imaging Applications: A Review
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SPAD Figures of Merit for Photon-Counting, Photon-Timing, and Imaging Applications: A Review

Bronzi, Danilo ; Villa, Federica ; Tisa, Simone ; Tosi, Alberto ; Zappa, Franco

IEEE sensors journal, 2016-01, Vol.16 (1), p.3-12 [Periódico revisado por pares]

New York: IEEE

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2
Monolithic sensor integration in CMOS technologies
Monolithic sensor integration in CMOS technologies
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Monolithic sensor integration in CMOS technologies

Fernandez, Daniel ; Michalik, Piotr ; Valle, Juan ; Banerji, Saoni ; Sanchez-Chiva, Josep M. ; Madrenas, Jordi

IEEE sensors journal, 2023-01, Vol.23 (2), p.1-1 [Periódico revisado por pares]

New York: IEEE

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3
An Economical Three-Dimension (3-D) Hall Device on 0.15-μm Bipolar-CMOS-DMOS (BCD) Platform
An Economical Three-Dimension (3-D) Hall Device on 0.15-μm Bipolar-CMOS-DMOS (BCD) Platform
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An Economical Three-Dimension (3-D) Hall Device on 0.15-μm Bipolar-CMOS-DMOS (BCD) Platform

Zhang, Long ; Zheng, Guiqiang ; Li, Yichen ; Li, Xueqi ; Sun, Xiaofeng ; Ma, Jie ; Zou, Min ; Wang, Dejin ; Zhang, Sen ; Li, Yongjia ; Liu, Siyang ; Sun, Weifeng

IEEE sensors journal, 2024-01, Vol.24 (7), p.9828 [Periódico revisado por pares]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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4
Time-Gated and Multi-Junction SPADs in Standard 65 nm CMOS Technology
Time-Gated and Multi-Junction SPADs in Standard 65 nm CMOS Technology
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Time-Gated and Multi-Junction SPADs in Standard 65 nm CMOS Technology

Jiang, Wei ; Chalich, Yamn ; Scott, Ryan ; Deen, M. Jamal

IEEE sensors journal, 2021-05, Vol.21 (10), p.12092-12103 [Periódico revisado por pares]

New York: IEEE

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5
Low Power CMOS Image Sensors Using Two Step Single Slope ADC With Bandwidth-Limited Comparators & Voltage Range Extended Ramp Generator for Battery-Limited Application
Low Power CMOS Image Sensors Using Two Step Single Slope ADC With Bandwidth-Limited Comparators & Voltage Range Extended Ramp Generator for Battery-Limited Application
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Low Power CMOS Image Sensors Using Two Step Single Slope ADC With Bandwidth-Limited Comparators & Voltage Range Extended Ramp Generator for Battery-Limited Application

Park, Himchan ; Yu, Changzhi ; Kim, Hyunmook ; Roh, Youngtaek ; Burm, Jinwook

IEEE sensors journal, 2020-03, Vol.20 (6), p.2831-2838 [Periódico revisado por pares]

New York: IEEE

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6
CMOS Image Sensor With Micro–Nano Holes to Improve NIR Optical Efficiency: Holes on Top Surface Versus on Bottom
CMOS Image Sensor With Micro–Nano Holes to Improve NIR Optical Efficiency: Holes on Top Surface Versus on Bottom
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CMOS Image Sensor With Micro–Nano Holes to Improve NIR Optical Efficiency: Holes on Top Surface Versus on Bottom

Devine, Ekaterina Ponizovskaya ; Ahamed, Ahasan ; Mayet, Ahmed S. ; Rawat, Amita ; Elrefaie, Aly F. ; Yamada, Toshishige ; Wang, Shih-Yuan ; Islam, M. Saif

IEEE sensors journal, 2023-09, Vol.23 (17), p.19256-19261 [Periódico revisado por pares]

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7
A Low Ripple and Fast Transient Response Charge Pump in CMOS Image Sensors
A Low Ripple and Fast Transient Response Charge Pump in CMOS Image Sensors
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A Low Ripple and Fast Transient Response Charge Pump in CMOS Image Sensors

Gao, Jing ; Zhao, Jianzhe ; Nie, Kaiming ; Xu, Jiangtao

IEEE sensors journal, 2024-01, Vol.24 (6), p.1-1 [Periódico revisado por pares]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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8
Gamma-Induced Image Degradation Analysis of Robot Vision Sensor for Autonomous Inspection of Nuclear Sites
Gamma-Induced Image Degradation Analysis of Robot Vision Sensor for Autonomous Inspection of Nuclear Sites
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Gamma-Induced Image Degradation Analysis of Robot Vision Sensor for Autonomous Inspection of Nuclear Sites

Khanam, Zeba ; Aslam, Bilal ; Saha, Sangeet ; Zhai, Xiaojun ; Ehsan, Shoaib ; Stolkin, Rustam ; McDonald-Maier, Klaus

IEEE sensors journal, 2022-09, Vol.22 (18), p.17378-17390 [Periódico revisado por pares]

New York: IEEE

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9
Hybrid CMOS and Pseudo-CMOS Organic Memory for Flexible Sensors
Hybrid CMOS and Pseudo-CMOS Organic Memory for Flexible Sensors
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Hybrid CMOS and Pseudo-CMOS Organic Memory for Flexible Sensors

Qin, Zhaoxing ; Kuribara, Kazunori ; Ogasahara, Yasuhiro ; Sato, Takashi

IEEE sensors journal, 2023-10, Vol.23 (20), p.24050-24059 [Periódico revisado por pares]

IEEE

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10
ISFETs in CMOS and Emergent Trends in Instrumentation: A Review
ISFETs in CMOS and Emergent Trends in Instrumentation: A Review
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ISFETs in CMOS and Emergent Trends in Instrumentation: A Review

Moser, Nicolas ; Lande, Tor Sverre ; Toumazou, Christofer ; Georgiou, Pantelis

IEEE sensors journal, 2016-09, Vol.16 (17), p.6496-6514 [Periódico revisado por pares]

New York: IEEE

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