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A resonant method for determining the residual stress and elastic modulus of a thin film
A resonant method for determining the residual stress and elastic modulus of a thin film
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A resonant method for determining the residual stress and elastic modulus of a thin film

Ma, Shujun ; Wang, Shiliang ; Iacopi, Francesca ; Huang, Han

Applied physics letters, 2013-07, Vol.103 (3) [Periódico revisado por pares]

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2
Core-shell designed high entropy alloy CoNiFeCuV-C nanoparticles for enhanced microwave absorption
Core-shell designed high entropy alloy CoNiFeCuV-C nanoparticles for enhanced microwave absorption
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Core-shell designed high entropy alloy CoNiFeCuV-C nanoparticles for enhanced microwave absorption

Hassan, Sibt ul ; Yang, Yang ; Qamar, Tauqeer Haider ; Shah, Mohsin ; Khan, Imran ; Hou, Lizhen ; Wang, Shiliang

Applied physics letters, 2024-03, Vol.124 (12) [Periódico revisado por pares]

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3
Size- and temperature-dependent Young's modulus of SiC nanowires determined by a laser-Doppler vibration measurement
Size- and temperature-dependent Young's modulus of SiC nanowires determined by a laser-Doppler vibration measurement
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Size- and temperature-dependent Young's modulus of SiC nanowires determined by a laser-Doppler vibration measurement

Yibibulla, Tursunay ; Jiang, Yijun ; Wang, Shiliang ; Huang, Han

Applied physics letters, 2021-01, Vol.118 (4) [Periódico revisado por pares]

Melville: American Institute of Physics

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4
Circular polarization analyzer with polarization tunable focusing of surface plasmon polaritons
Circular polarization analyzer with polarization tunable focusing of surface plasmon polaritons
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Circular polarization analyzer with polarization tunable focusing of surface plasmon polaritons

Wang, Sen ; Wang, Xinke ; Kan, Qiang ; Qu, Shiliang ; Zhang, Yan

Applied physics letters, 2015-12, Vol.107 (24) [Periódico revisado por pares]

Melville: American Institute of Physics

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5
The kinetic friction between a nanowire and a flat substrate measured using nanomanipulation with optical microscopy
The kinetic friction between a nanowire and a flat substrate measured using nanomanipulation with optical microscopy
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The kinetic friction between a nanowire and a flat substrate measured using nanomanipulation with optical microscopy

Wang, Shiliang ; Hou, Lizhen ; Xie, Hongtao ; Huang, Han

Applied physics letters, 2015-09, Vol.107 (10) [Periódico revisado por pares]

Melville: American Institute of Physics

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6
Novel tungsten oxide microneedles with nanosized tips
Novel tungsten oxide microneedles with nanosized tips
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Novel tungsten oxide microneedles with nanosized tips

He, Yuehui ; Wang, Shiliang ; Huang, Baiyun ; Liu, C. T. ; Liaw, P. K.

Applied physics letters, 2006-05, Vol.88 (22), p.223107-223107-2 [Periódico revisado por pares]

American Institute of Physics

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7
Pressure sensing element based on the BN–graphene–BN heterostructure
Pressure sensing element based on the BN–graphene–BN heterostructure
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Pressure sensing element based on the BN–graphene–BN heterostructure

Li, Mengwei ; Wu, Chenggen ; Zhao, Shiliang ; Deng, Tao ; Wang, Junqiang ; Liu, Zewen ; Wang, Li ; Wang, Gao

Applied physics letters, 2018-04, Vol.112 (14) [Periódico revisado por pares]

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8
Surface enhanced Raman scattering of aged graphene: Effects of annealing in vacuum
Surface enhanced Raman scattering of aged graphene: Effects of annealing in vacuum
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Surface enhanced Raman scattering of aged graphene: Effects of annealing in vacuum

Wang, Yingying ; Ni, Zhenhua ; Li, Aizhi ; Zafar, Zainab ; Zhang, Yan ; Ni, Zhonghua ; Qu, Shiliang ; Qiu, Teng ; Yu, Ting ; Xiang Shen, Ze

Applied physics letters, 2011-12, Vol.99 (23), p.233103-233103-3 [Periódico revisado por pares]

United States: American Institute of Physics

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9
Interfacial energy level bending in a crystalline p/p-type organic heterostructure
Interfacial energy level bending in a crystalline p/p-type organic heterostructure
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Interfacial energy level bending in a crystalline p/p-type organic heterostructure

Zhu, Feng ; Grobosch, Mandy ; Treske, Uwe ; Knupfer, Martin ; Huang, Lizhen ; Ji, Shiliang ; Yan, Donghang

Applied physics letters, 2011-05, Vol.98 (20), p.203303-203303-3 [Periódico revisado por pares]

United States: American Institute of Physics

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10
Superconducting properties of Ba(Fe1– x Ni x )2As2 thin films in high magnetic fields
Superconducting properties of Ba(Fe1– x Ni x )2As2 thin films in high magnetic fields
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Superconducting properties of Ba(Fe1– x Ni x )2As2 thin films in high magnetic fields

Richter, Stefan ; Kurth, Fritz ; Iida, Kazumasa ; Pervakov, Kirill ; Pukenas, Aurimas ; Tarantini, Chiara ; Jaroszynski, Jan ; Hänisch, Jens ; Grinenko, Vadim ; Skrotzki, Werner ; Nielsch, Kornelius ; Hühne, Ruben

Applied physics letters, 2017-01, Vol.110 (2) [Periódico revisado por pares]

Melville: American Institute of Physics

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