Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Artigo
|
An argument for proof testing brittle microsystems in high-reliability applicationsBoyce, B L ; Ballarini, R ; Chasiotis, IApplied Physics Letters, 2008-11, Vol.18 (11), p.117001-117001 (4) [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
|
2 |
Material Type: Artigo
|
Fracture toughness of polycrystalline silicon carbide thin filmsBellante, J. J. ; Kahn, H. ; Ballarini, R. ; Zorman, C. A. ; Mehregany, M. ; Heuer, A. H.Applied physics letters, 2005-02, Vol.86 (7), p.071920-071920-3 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |