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Refinado por: autor: Williams, David remover assunto: Exact Sciences And Technology remover Base de dados/Biblioteca: IOP Publishing Journals remover
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Three-dimensional Morphology of a Coronal Prominence Cavity
Three-dimensional Morphology of a Coronal Prominence Cavity
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Three-dimensional Morphology of a Coronal Prominence Cavity

Gibson, S. E ; Kucera, T. A ; Rastawicki, D ; Dove, J ; de Toma, G ; Hao, J ; Hill, S ; Hudson, H. S ; Marqué, C ; McIntosh, P. S ; Rachmeler, L ; Reeves, K. K ; Schmieder, B ; Schmit, D. J ; Seaton, D. B ; Sterling, A. C ; Tripathi,   D ; Williams, D. R ; Zhang, M

The Astrophysical journal, 2010-12, Vol.724 (2), p.1133-1146 [Periódico revisado por pares]

Bristol: IOP Publishing

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Explanation for initiation of pitting corrosion of stainless steels at sulfide inclusions
Explanation for initiation of pitting corrosion of stainless steels at sulfide inclusions
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Explanation for initiation of pitting corrosion of stainless steels at sulfide inclusions

WILLIAMS, D. E ; YING YANG ZHU

Journal of the Electrochemical Society, 2000-05, Vol.147 (5), p.1763-1766 [Periódico revisado por pares]

Pennington, NJ: Electrochemical Society

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3
Elucidation of a trigger mechanism for pitting corrosion of stainless steels using submicron resolution scanning electrochemical and photoelectrochemical microscopy
Elucidation of a trigger mechanism for pitting corrosion of stainless steels using submicron resolution scanning electrochemical and photoelectrochemical microscopy
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Elucidation of a trigger mechanism for pitting corrosion of stainless steels using submicron resolution scanning electrochemical and photoelectrochemical microscopy

WILLIAMS, D. E ; MOHIUDDIN, T. F ; YING YANG ZHU

Journal of the Electrochemical Society, 1998-08, Vol.145 (8), p.2664-2672 [Periódico revisado por pares]

Pennington, NJ: Electrochemical Society

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4
Observations of Doppler Shift Oscillations with the EUV Imaging Spectrometer on Hinode
Observations of Doppler Shift Oscillations with the EUV Imaging Spectrometer on Hinode
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Observations of Doppler Shift Oscillations with the EUV Imaging Spectrometer on Hinode

Mariska, John T ; Warren, Harry P ; Williams, David R ; Watanabe, Tetsuya

The Astrophysical journal, 2008-07, Vol.681 (1), p.L41-L44 [Periódico revisado por pares]

Chicago, IL: IOP Publishing

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5
Scanning electrochemical microscopic observation of a precursor state to pitting corrosion of stainless steel
Scanning electrochemical microscopic observation of a precursor state to pitting corrosion of stainless steel
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Scanning electrochemical microscopic observation of a precursor state to pitting corrosion of stainless steel

ZHU, Y ; WILLIAMS, D. E

Journal of the Electrochemical Society, 1997-03, Vol.144 (3), p.L43-L45 [Periódico revisado por pares]

Pennington, NJ: Electrochemical Society

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6
A simple equivalent circuit model to represent microstructure effects on the response of semiconducting oxide-based gas sensors
A simple equivalent circuit model to represent microstructure effects on the response of semiconducting oxide-based gas sensors
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A simple equivalent circuit model to represent microstructure effects on the response of semiconducting oxide-based gas sensors

Chabanis, Gilles ; Parkin, Ivan P ; Williams, David E

Measurement science & technology, 2003-01, Vol.14 (1), p.76-86 [Periódico revisado por pares]

Bristol: IOP Publishing

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7
Band structure and waveguide modelling of epitaxially regrown photonic crystal surface-emitting lasers
Band structure and waveguide modelling of epitaxially regrown photonic crystal surface-emitting lasers
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Band structure and waveguide modelling of epitaxially regrown photonic crystal surface-emitting lasers

Taylor, Richard J E ; Williams, David M ; Orchard, Jon R ; Childs, David T D ; Khamas, Salam ; Hogg, Richard A

Journal of physics. D, Applied physics, 2013-07, Vol.46 (26), p.264005-1-8 [Periódico revisado por pares]

Bristol: IOP Publishing

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8
Superconducting nanotransistor based digital logic gates
Superconducting nanotransistor based digital logic gates
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Superconducting nanotransistor based digital logic gates

Lee, Seung-Beck ; Hutchinson, Gregory D ; Williams, David A ; Hasko, David G ; Ahmed, Haroon

Nanotechnology, 2003-02, Vol.14 (2), p.188-191 [Periódico revisado por pares]

Bristol: IOP Publishing

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9
Simple system for part-per-billion-level volatile organic compound analysis in groundwater and urban air
Simple system for part-per-billion-level volatile organic compound analysis in groundwater and urban air
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Simple system for part-per-billion-level volatile organic compound analysis in groundwater and urban air

Morris, Ljiubov ; Caruana, Daren J ; Williams, David E

Measurement science & technology, 2002-04, Vol.13 (4), p.603-612 [Periódico revisado por pares]

Bristol: IOP Publishing

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10
DISSOLUTION AND REACTION OF SULFIDE INCLUSIONS IN STAINLESS-STEEL IMAGED USING SCANNING LASER PHOTOELECTROCHEMICAL MICROSCOPY
DISSOLUTION AND REACTION OF SULFIDE INCLUSIONS IN STAINLESS-STEEL IMAGED USING SCANNING LASER PHOTOELECTROCHEMICAL MICROSCOPY
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DISSOLUTION AND REACTION OF SULFIDE INCLUSIONS IN STAINLESS-STEEL IMAGED USING SCANNING LASER PHOTOELECTROCHEMICAL MICROSCOPY

KUCERNAK, ARJ ; PEAT, R ; WILLIAMS, DE

Journal of the Electrochemical Society, 1992-08, Vol.139 (8), p.2337-2340 [Periódico revisado por pares]

PENNINGTON: Electrochemical Soc Inc

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