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Refinado por: Base de dados/Biblioteca: IEEE Electronic Library (IEL) Conference Proceedings remover
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1
International Conference on Cyberworlds, CW 2021. Proceedings: 28-30 September 2021, Caen, France
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International Conference on Cyberworlds, CW 2021. Proceedings: 28-30 September 2021, Caen, France

Sourin, Alexei ; Rosenberger, Christophe ; Sourina, Olga

IEEE Computer Society Conference Publishing Services (CPS), Los Alamitos, Calif 2021

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2
IEEE Symposium on Visualization for Cyber Security, VizSec 2020. Proceedings: Virtual, October 28, 2020
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IEEE Symposium on Visualization for Cyber Security, VizSec 2020. Proceedings: Virtual, October 28, 2020

Kohlhammer, Jörn

IEEE, Piscataway, NJ 2020

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3
ITG-Fb. 289: Smart SysTech 2019: European Conference on Smart Objects, Systems and Technologies June 04- 05, 2019, Fraunhofer Institute for Factory Operation and Automation IFF Magedeburg, Germany
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Livro
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ITG-Fb. 289: Smart SysTech 2019: European Conference on Smart Objects, Systems and Technologies June 04- 05, 2019, Fraunhofer Institute for Factory Operation and Automation IFF Magedeburg, Germany

VDE ITG

VDE Verlag 2019

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4
IEEE Symposium on Visualization for Cyber Security, VizSec 2019: Vancouver, Canada, October 23, 2019
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IEEE Symposium on Visualization for Cyber Security, VizSec 2019: Vancouver, Canada, October 23, 2019

Gove, Robert ; Arendt, D ; Kohlhammer, Jörn ; Angelini, M ; Paul, C.L ; Bryan, C ; McKenna, S ; Prigent, N ; Najafi, P ; Sopan, A

IEEE, Piscataway, NJ 2019

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5
29th biennial symposium on communications : Toronto, Ontario, Canada, June 6-7, 2018
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Livro
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29th biennial symposium on communications : Toronto, Ontario, Canada, June 6-7, 2018

Miri, Ali ; Dong, Xiaodai ; Ardakani, Masoud ; Garcia-Alfaro, Joaquin

IEEE Computer Society 2018

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6
22nd International Conference on Ion Implantation Technology, IIT 2018. Proceedings: 16-21 September 2018, Würzburg, Germany
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22nd International Conference on Ion Implantation Technology, IIT 2018. Proceedings: 16-21 September 2018, Würzburg, Germany

Häublein, Volker ; Ryssel, H

IEEE, Piscataway, NJ 2018

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7
4th International Workshop on Requirements Engineering for Self-Adaptive, Collaborative, and Cyber Physical Systems, RESACS 2018. Proceedings: 20 August 2018, Banff, Alberta, Canada
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4th International Workshop on Requirements Engineering for Self-Adaptive, Collaborative, and Cyber Physical Systems, RESACS 2018. Proceedings: 20 August 2018, Banff, Alberta, Canada

Tenbergen, Bastian ; Daun, Marian ; Palomares, Christina ; Knauss, Alessia ; Diederichs, Frederik

IEEE Computer Society Conference Publishing Services (CPS), Los Alamitos, Calif 2018

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8
Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, DTIP 2018: Roma, Italy, May 22nd - May 25th, 2018
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Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, DTIP 2018: Roma, Italy, May 22nd - May 25th, 2018

Mailly, Frédérick ; Marcelli, Romolo ; Mita, Yoshio ; Nouet, Pascal ; Pressecq, Francis ; Schneider, Peter ; Smith, Steward

IEEE, Piscataway, NJ 2018

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9
IWSM-Mensura 2016, 26th International Workshop on Software Measurement (IWSM) and the 11th International Conference on Software Process and Product Measurement (Mensura). Proceedings: 5-7 October 2016, Berlin, Germany
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IWSM-Mensura 2016, 26th International Workshop on Software Measurement (IWSM) and the 11th International Conference on Software Process and Product Measurement (Mensura). Proceedings: 5-7 October 2016, Berlin, Germany

Heidrich, Jens ; Vogelezang, Frank

IEEE Computer Society Conference Publishing Services (CPS), Los Alamitos, Calif 2016

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10
Multi-step Monte Carlo calculations applied to nuclear reactor instrumentation - Source definition and renormalization to physical values
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Multi-step Monte Carlo calculations applied to nuclear reactor instrumentation - Source definition and renormalization to physical values

Radulovic, Vladimir ; Barbot, Loic ; Fourmentel, Damien ; Villard, Jean-Francois ; Zerovnik, Gasper ; Snoj, Luka ; Trkov, Andrej

2015 4th International Conference on Advancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA), 2015, p.1-6

United States: IEEE

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